| Organizational resilience and employee performance in COVID-19 pandemic: the mediating effect of emotional intelligence A Dhoopar, P Sihag, A Kumar, AK Suhag International Journal of Organizational Analysis 30 (1), 130-155, 2021 | 39 | 2021 |
| A survey – Energy harvesting sources and techniques for internet of things devices MCAS Pooja Choudhary, Lava Bhargava, Virendra Singh Material Today: Proceedings, 2020 | 34 | 2020 |
| Integrated healthcare monitoring solutions for soldier using the internet of things with distributed computing AS Shuvabrata Bandopadhaya, Rajiv Dey Sustainable Computing: Informatics and Systems 26 (June 2020), 2020 | 26 | 2020 |
| Approximate computing: Evolutionary methods for functional approximation of digital circuits P Choudhary, L Bhargava, V Singh, AK Suhag Materials Today: Proceedings 66, 3487-3492, 2022 | 11 | 2022 |
| Delay testable enhanced scan flip-flop: DFT for high fault coverage AK Suhag, V Shrivastava 2011 International Symposium on Electronic System Design, 129-133, 2011 | 11 | 2011 |
| An era of internet of things leads to smart cities initiatives towards urbanization P Choudhary, L Bhargava, AK Suhag, M Choudhary, S Singh Digital Cities Roadmap: IoT‐Based Architecture and Sustainable Buildings …, 2021 | 9 | 2021 |
| Test vector reordering by using hybrid genetic algorithm-simulated annealing for lower switching activity KV Reddy, MV Bharath, AK Suhag, M Sinha 2018 4th International Conference on Computing Communication and Automation …, 2018 | 9 | 2018 |
| Elimination of output gating performance overhead for critical paths in scan test AK Suhag, S Ahlawat, V Shrivastava, N Singh International Journal of Circuits and Architecture Design 1 (1), 62-73, 2013 | 9 | 2013 |
| Design and simulation of nanoscale double gate MOSFET using high K material and ballistic transport method AK Suhag, R Sharma Materials Today: Proceedings 4 (9), 10412-10416, 2017 | 8 | 2017 |
| Deposition and characterization of amorphous electroless Ni-Co-P alloy thin film for ULSI application A Kumar, AK Suhag, A Singh, SK Sharma, M Kumar, D Kumar Materials Research Express 1 (3), 035007, 2014 | 5 | 2014 |
| Universal pattern set for arithmetic circuits A Kumar, RR Choudhary, P Bhardwaj, MS Dhaka, R Choudhary International Journal of Computer Applications 40 (15), 0975-8887, 2012 | 5 | 2012 |
| Approximating arithmetic circuits for IoT devices data processing P Choudhary, L Bhargava, M Fujita, V Singh, AK Suhag Computers & Industrial Engineering 174, 108792, 2022 | 4 | 2022 |
| A cost effective technique for diagnosis of scan chain faults S Ahlawat, D Vaghani, J Tudu, A Suhag International Symposium on VLSI Design and Test, 191-204, 2017 | 4 | 2017 |
| Output gating performance overhead elimination for scan test AK Suhag, S Ahlawat, V Shrivastava, RR Choudhary International Journal of Electronics 102 (7), 1244-1252, 2015 | 4 | 2015 |
| Dual frequency gyrotron operating at 42/84 GHz for plasma fusion application N Kumar, U Singh, A Sihag, AK Sinha Vacuum 113, 43-51, 2015 | 4 | 2015 |
| Performance evaluation of delay testable enhanced scan flip-flop AK Suhag, V Shrivastava International Journal of System Assurance Engineering and Management 3, 169-174, 2012 | 4 | 2012 |
| Removal of impulse noise for multimedia-IoT applications at gateway level A Roy, S Bandopadhaya, S Chandra, A Suhag Multimedia Tools and Applications 81 (24), 34463-34480, 2022 | 3 | 2022 |
| Flip–flop selection for partial enhance scan chain using DTESFF for high transition delay fault coverage AK Suhag, V Shrivastava, N Singh International Journal of System Assurance Engineering and Management 4, 303-311, 2013 | 3 | 2013 |
| Study of Crucial Processes in the Fabrication of MEMS Hotplate Sensor Structure VK Khanna, M Prasad, A Suhag, MK Sharma, VK Dwivedi, C Shekhar Proceedings of the ISSSMEMS’2006, National Conference on Smart Structures …, 2006 | 3 | 2006 |
| Reduction of test data volume using DTESFF-based partial enhanced scan method AK Suhag Harmony Search and Nature Inspired Optimization Algorithms: Theory and …, 2019 | 2 | 2019 |
Dr. Udaybir SinghSenior Technical Officer, CSIR-Central Scientific Instruments Organisation,IndiaVerified email at csio.res.in
