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Citations per year
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Cited by
All
Since 2019
Citations
15
15
h-index
2
2
i10-index
0
0
0
6
3
2022
2023
2024
4
6
5
Follow
Ved Prakash Sharma
Indian Institute of Technology Delhi
Verified email at iitd.ac.in
Microelectronics Reliability
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Cited by
Year
Effect of aging time and loading rate on fracture behavior of Cu/Sn-0.7 Cu solder joints
VP Sharma, NV Datla
Microelectronics Reliability 127, 114381
, 2021
8
2021
Effect of bond-line thickness and mode-mixity on the fracture behavior and traction separation law of Sn-0.7 Cu solder joints
VP Sharma, NV Datla
Engineering Failure Analysis, 105855
, 2021
5
2021
Fracture Behavior and Reliability of Low-Silver Lead-free Solder Joints
VP Sharma, N Datla
Journal of Electronic Packaging
, 2022
2
2022
Atmospheric Water Generation with Different Grades of Molecular Sieve
VRK Manoj kumar, Avadhesh Yadav, Ravi Kant Ravi, Ved Prakash Sharma
Highly Efficient Thermal Renewable Energy Systems Design, Optimization and …
, 2024
2024
Automation in Welding Industries
DK Naik, VP Sharma, R Dinesh Kumar
Automation in Welding Industry: Incorporating Artificial Intelligence …
, 2024
2024
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