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Dr.-Ing. Nidhi Chaturvedi
Dr.-Ing. Nidhi Chaturvedi
Senior Principal Scientist, CSIR-CEERI
Verified email at ceeri.ernet.in - Homepage
Title
Cited by
Cited by
Year
Mechanism of ohmic contact formation in AlGaN/GaN high electron mobility transistors
N Chaturvedi, U Zeimer, J Würfl, G Tränkle
Semiconductor Science and technology 21 (2), 175, 2006
702006
The prevalence of hepatitis C virus antibodies among the voluntary blood donors of New Delhi, India
A Jain, SS Rana, P Chakravarty, RK Gupta, NS Murthy, MC Nath, ...
European journal of epidemiology 18, 695-698, 2003
702003
Optimal interconnections to address partial shading losses in solar photovoltaic arrays
S Pareek, N Chaturvedi, R Dahiya
Solar Energy 155, 537-551, 2017
672017
Highly rugged 30 GHz GaN low-noise amplifiers
M Rudolph, N Chaturvedi, K Hirche, J Wurfl, W Heinrich, GÜ Trankle
IEEE Microwave and Wireless Components Letters 19 (4), 251-253, 2009
472009
High-resolution AlGaN/GaN HEMT-based electrochemical sensor for biomedical applications
N Sharma, S Mishra, K Singh, N Chaturvedi, A Chauhan, C Periasamy, ...
IEEE Transactions on Electron Devices 67 (1), 289-295, 2019
352019
On the recovery time of highly robust low-noise amplifiers
A Liero, M Dewitz, N Chaturvedi, J Xu, M Rudolph
IEEE transactions on microwave theory and techniques 58 (4), 781-787, 2010
352010
Highly robust X-band LNA with extremely short recovery time
M Rudolph, M Dewitz, A Liero, I Khalil, N Chaturvedi, C Wipf, ...
2009 IEEE MTT-S International Microwave Symposium Digest, 781-784, 2009
292009
Highly Robust X-Band LNA with Extremely Short Recovery Time
GT Matthias Rudolph, Mike Dewitz, Armin Liero, Ibrahim Khalil, Nidhi ...
IEEE MTT-S International Microwave Symposium digest 7June, 2009, Boston, USA …, 2009
29*2009
Highly Robust X-Band LNA with Extremely Short Recovery Time
GT Matthias Rudolph, Mike Dewitz, Armin Liero, Ibrahim Khalil, Nidhi ...
IEEE MTT-S International Microwave Symposium digest 7June, 2009, Boston,USA …, 2009
29*2009
Investigation and reduction of leakage current associated with gate encapsulation by SiNx in AlGaN/GaN HFETs
SA Chevtchenko, P Kurpas, N Chaturvedi, R Lossy, J Würfl
2011 International Conference on Compound Semiconductor Manufacturing …, 2011
282011
Large area AlGaN/GaN HEMTs grown on insulating silicon carbide substrates
R Lossy, N Chaturvedi, P Heymann, J Würfl, S Müller, K Köhler
physica status solidi (a) 194 (2), 460-463, 2002
232002
AlGaN/GaN HEMT based sensor and system for polar liquid detection
N Chaturvedi, K Singh, P Kachhawa, R Lossy, S Mishra, A Chauhan, ...
Sensors and Actuators A: Physical 302, 111799, 2020
192020
Refined isolation techniques for GaN-based high electron mobility transistors
N Sharma, SK Dhakad, C Periasamy, N Chaturvedi
Materials science in semiconductor processing 87, 195-201, 2018
172018
Detection of heavy metal ions using meander gated GaN HEMT sensor
S Mishra, P Kachhawa, RR Thakur, AK Jain, K Singh, N Chaturvedi
Sensors and Actuators A: Physical 332, 113119, 2021
162021
GaN HEMT based biosensor for the detection of breast cancer marker (C-erbB2)
N Chaturvedi, R Chowdhury, S Mishra, K Singh, N Chaturvedi, ...
Semiconductor Science and Technology 36 (4), 045018, 2021
162021
Influence of AlGaN and InGaN back barriers on the performance of AlGaN/GaN HEMT
SP Singh, N Chaturvedi
IETE Technical Review 33 (1), 40-44, 2016
162016
Antigen-antibody interaction-based GaN HEMT biosensor for C3G detection
P Kachhawa, S Mishra, AK Jain, C Tripura, J Joseph, V Radha, ...
IEEE Sensors Journal 22 (7), 6256-6262, 2022
152022
Optimization of ohmic contacts on thick and thin AlGaN/GaN HEMTs structures
S Dhakad, N Sharma, C Periasamy, N Chaturvedi
Superlattices and Microstructures 111, 922-926, 2017
152017
High temperature characterization of Pt‐based Schottky diodes on AlGaN/GaN heterostructures
J Pedrós, R Cuerdo, R Lossy, N Chaturvedi, J Würfl, F Calle
physica status solidi c 3 (6), 1709-1712, 2006
142006
Investigation of high-temperature effects on the performance of AlGaN/GaN high electron mobility transistors
N Sharma, C Periasamy, N Chaturvedi
Journal of Nanoelectronics and Optoelectronics 11 (6), 694-701, 2016
122016
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