Broadband electromagnetic cloaking with smart metamaterials D Shin, Y Urzhumov, Y Jung, G Kang, S Baek, M Choi, H Park, K Kim, ... Nature Communications 3, 1213, 2012 | 204 | 2012 |
Broadband Optical Antireflection Enhancement by Integrating Antireflective Nanoislands with Silicon Nanoconical‐Frustum Arrays H Park, D Shin, G Kang, S Baek, K Kim, WJ Padilla Advanced Materials 23 (48), 5796-5800, 2011 | 115 | 2011 |
Broadband Light‐Trapping Enhancement in an Ultrathin Film a‐Si Absorber Using Whispering Gallery Modes and Guided Wave Modes with Dielectric Surface‐Textured Structures G Kang, H Park, D Shin, S Baek, M Choi, DH Yu, K Kim, WJ Padilla Advanced Materials 25 (18), 2617-2623, 2013 | 70 | 2013 |
Tunable subwavelength focusing with dispersion-engineered metamaterials in the terahertz regime J Lee, K Lee, H Park, G Kang, DH Yu, K Kim Optics letters 35 (13), 2254-2256, 2010 | 27 | 2010 |
Active phase control of a Ag near-field superlens via the index mismatch approach K Lee, Y Jung, G Kang, H Park, K Kim Applied Physics Letters 94 (10), 101113, 2009 | 23 | 2009 |
Improved image quality of a Ag slab near-field superlens with intrinsic loss of absorption K Lee, H Park, J Kim, G Kang, K Kim Optics express 16 (3), 1711-1718, 2008 | 22 | 2008 |
Quantitative analysis of mixed hydrofluoric and nitric acids using Raman spectroscopy with partial least squares regression G Kang, K Lee, H Park, J Lee, Y Jung, K Kim, B Son, H Park Talanta 81 (4), 1413-1417, 2010 | 15 | 2010 |
Optical microscope illumination analysis using through-focus scanning optical microscopy RK Attota, H Park Optics Letters 42 (12), 2306 - 2309, 2017 | 14 | 2017 |
Contact Electrification of Individual Dielectric Microparticles Measured by Optical Tweezers in Air H Park, TW LeBrun ACS applied materials & interfaces 8 (50), 34904-34913, 2016 | 14 | 2016 |
Parametric force analysis for measurement of arbitrary optical forces on particles trapped in air or vacuum H Park, TW LeBrun ACS Photonics 2 (10), 1451-1459, 2015 | 12 | 2015 |
TSV reveal height and dimension metrology by the TSOM method V Vartanian, R Attota, H Park, G Orji, RA Allen Proc. SPIE 8681, 86812F, 2013 | 9 | 2013 |
Reliable optical measurement of water vapor in highly scattering environment H Park, K Lee, G Kang, S Song, Y Jung, K Kim, J Bae, J Lee, H Park Spectrochimica Acta Part A: Molecular and Biomolecular Spectroscopy 72 (3 …, 2009 | 6 | 2009 |
Optical Trap Loading of Dielectric Microparticles In Air H Park, TW LeBrun JoVE (Journal of Visualized Experiments), e54862-e54862, 2017 | 3 | 2017 |
Tunable subwavelength focusing with slit-groove-based metamaterials in THz J Lee, K Lee, H Park, G Kang, DH Yu, K Kim Proceedings of SPIE 7754, 77541I, 2010 | 2 | 2010 |
Measurement and accumulation of electric charge on a single dielectric particle trapped in air H Park, TW LeBrun Proc. of SPIE Vol 9764, 97640L-1, 2016 | 1 | 2016 |
Measuring forces and dynamics for optically levitated 20μm PS particles in air using electrostatic modulation H Park, TW LeBrun SPIE Nanoscience+ Engineering, 95480E-95480E-5, 2015 | 1* | 2015 |
Compensation of focus blurring of Ag slab superlens with intrinsic loss of absorption K Lee, H Park, J Kim, G Kang, K Kim Lasers and Electro-Optics, 2008 and 2008 Conference on Quantum Electronics …, 2008 | 1 | 2008 |
Variation of the confocal parameters of silver nano superlens. K Lee, J Kim, H Park, K Kim Proc. of SPIE Vol 6642, 66421D-1, 2007 | 1 | 2007 |
Forces and dynamics of optically levitated polystyrene particles in air using electrostatic modulation H Park, TW LeBrun Proc. of Vol 9548, 95480E, 0 | 1* | |
TSV Reveal height and bump dimension metrology by the TSOM method R Attota, H Park, VH Vartanian, NG Orji, RA Allen SPIE Advanced Lithography, 2013 | | 2013 |