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HV PoorMichael Henry Strater University Professor, Princeton UniversityVerified email at princeton.edu
Rui ZhangNational University of SingaporeVerified email at nus.edu.sg
Zhi-Quan LuoProfessor, The Chinese University of Hong Kong, Shenzhen, ChinaVerified email at cuhk.edu.cn
Zhi QuanShenzhen UniversityVerified email at szu.edu.cn
Ali H SayedDean of Engineering, EPFL, SwitzerlandVerified email at epfl.ch
Long GaoSamsungVerified email at samsung.com
Changchuan YinProfessor of Electrical Engineering, Beijing University of Posts and TelecommunicationsVerified email at bupt.edu.cn
Ying-Chang LiangIEEE Fellow & Highly Cited Researcher, UESTC, ChinaVerified email at ieee.org
Soummya KarElectrical and Computer Engineering, Carnegie Mellon UniversityVerified email at andrew.cmu.edu
Sanjay LallStanford UniversityVerified email at stanford.edu
Jinhua JiangQualcomm IncVerified email at qualcomm.com
Zhi DingDistinguished Professor of Electrical and Computer Engineering, University of California DavisVerified email at ucdavis.edu
Marwan KrunzProfessor of Electrical and Computer Engineering, University of ArizonaVerified email at arizona.edu
Jun-Hong CuiUniversity of ConnecticutVerified email at engr.uconn.edu
Shengli ZhouProfessor of Electrical and Computer Engineering, University of ConnecticutVerified email at engr.uconn.edu
Zhu HanUniversity of HoustonVerified email at uh.edu
Tie LiuTexas A&M UniversityVerified email at tamu.edu
Lili ZhangCorporate R&D, Qualcomm Inc.Verified email at tamu.edu
Costas N. GeorghiadesDelbert A. Whitaker Chair Professor of ECE, Texas A&M UniversityVerified email at tamu.edu
Wing-Kin MaDepartment of Electronic Engineering, The Chinese University of Hong KongVerified email at ieee.org
Shuguang Cui
Chair Professor, School of Science and Engineering, CUHKSZ
Verified email at cuhk.edu.cn - Homepage