| Full-scan LBIST with capture-per-cycle hybrid test points S Milewski, N Mukherjee, J Rajski, J Solecki, J Tyszer, J Zawada 2017 IEEE International Test Conference (ITC), 1-9, 2017 | 19 | 2017 |
| On reduction of deterministic test pattern sets S Eggersglüß, S Milewski, J Rajski, J Tyszer 2021 IEEE International Test Conference (ITC), 260-267, 2021 | 16 | 2021 |
| Test time and area optimized brst scheme for automotive ics N Mukherjee, D Tille, M Sapati, Y Liu, J Mayer, S Milewski, E Moghaddam, ... 2019 IEEE International Test Conference (ITC), 1-10, 2019 | 13 | 2019 |
| Time and area optimized testing of automotive ICs N Mukherjee, D Tille, M Sapati, Y Liu, J Mayer, S Milewski, E Moghaddam, ... IEEE Transactions on Very Large Scale Integration (VLSI) Systems 29 (1), 76-88, 2020 | 12 | 2020 |
| Low cost hypercompression of test data Y Huang, S Milewski, J Rajski, J Tyszer, C Wang IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2019 | 9 | 2019 |
| X-tolerant compactor maXpress for in-system test applications with observation scan Y Liu, S Milewski, G Mrugalski, N Mukherjee, J Rajski, J Tyszer, ... IEEE Transactions on Very Large Scale Integration (VLSI) Systems 29 (8 …, 2021 | 8 | 2021 |
| Test application time reduction using capture-per-cycle test points J Rajski, S Milewski, N Mukherjee, J Solecki, J Tyszer, J Zawada US Patent 10,509,072, 2019 | 6 | 2019 |
| Hypercompression of test patterns Y Huang, S Milewski, J Rajski, J Tyszer, C Wang 2018 IEEE International Test Conference (ITC), 1-9, 2018 | 5 | 2018 |
| Test generation using testability-based guidance S Milewski, J Rajski, Y Huang US Patent 10,996,273, 2021 | 3 | 2021 |
| X-tolerant tunable compactor for in-system test Y Liu, S Milewski, G Mrugalski, N Mukherjee, J Rajski, J Tyszer, ... 2020 IEEE International Test Conference (ITC), 1-10, 2020 | 3 | 2020 |
| Low power testing based on dynamic grouping of scan J Rajski, S Milewski, G Mrugalski, J Tyszer US Patent 10,120,029, 2018 | 3 | 2018 |
| Low power test compression with programmable broadcast-based control S Milewski, G Mrugalski, J Rajski, J Tyszer 2014 IEEE 23rd Asian Test Symposium, 174-179, 2014 | 3 | 2014 |
| Autonomous Scan Patterns for Laser Voltage Imaging WT Cheng, S Milewski, G Mrugalski, J Rajski, M Trawka, J Tyszer IEEE Transactions on Emerging Topics in Computing 9 (2), 680-691, 2019 | 1 | 2019 |
| A New Static Compaction of Deterministic Test Sets S Eggersglüß, S Milewski, J Rajski, J Tyszer IEEE Transactions on Very Large Scale Integration (VLSI) Systems 31 (4), 411-420, 2023 | | 2023 |
| Isometric control data generation for test compression Y Huang, J Rajski, S Milewski US Patent 11,422,188, 2022 | | 2022 |
| Flexible isometric decompressor architecture for test compression J Rajski, Y Huang, S Milewski, J Tyszer US Patent 11,150,299, 2021 | | 2021 |
| HYPERCOMPRESSION OF TEST DATA S MILEWSKI | | |
Janusz RajskiVice President of Engineering, SiemensVerified email at mentor.com
Janusz RajskiVice President of Engineering, SiemensVerified email at mentor.com