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Bikram Mahajan
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Materials, processes, and facile manufacturing for bioresorbable electronics: a review
X Yu, W Shou, BK Mahajan, X Huang, H Pan
Advanced Materials 30 (28), 1707624, 2018
1482018
Low‐cost manufacturing of bioresorbable conductors by evaporation–condensation‐mediated laser printing and sintering of Zn nanoparticles
W Shou, BK Mahajan, B Ludwig, X Yu, J Staggs, X Huang, H Pan
Advanced Materials 29 (26), 1700172, 2017
1082017
Mechanically milled irregular zinc nanoparticles for printable bioresorbable electronics
BK Mahajan, X Yu, W Shou, H Pan, X Huang
Small 13 (17), 1700065, 2017
692017
Materials, mechanics, and patterning techniques for elastomer-based stretchable conductors
X Yu, BK Mahajan, W Shou, H Pan
Micromachines 8 (1), 7, 2016
672016
Enlarged broad band photodetection using Indium doped TiO2 alloy thin film
MB Sarkar, A Mondal, B Choudhuri, BK Mahajan, S Chakrabartty, ...
Journal of alloys and compounds 615, 440-445, 2014
462014
A device-to-system perspective regarding self-heating enhanced hot carrier degradation in modern field-effect transistors: A topical review
MA Alam, BK Mahajan, YP Chen, W Ahn, H Jiang, SH Shin
IEEE Transactions on Electron Devices 66 (11), 4556-4565, 2019
412019
Aerosol printing and photonic sintering of bioresorbable zinc nanoparticle ink for transient electronics manufacturing
BK Mahajan, B Ludwig, W Shou, X Yu, E Fregene, H Xu, H Pan, X Huang
Science China Information Sciences 61, 1-10, 2018
352018
Electrothermal performance limit of β-Ga2O3 field-effect transistors
BK Mahajan, YP Chen, J Noh, PD Ye, MA Alam
Applied Physics Letters 115 (17), 2019
312019
Barrier modification of metal-contact on silicon by sub-2 nm platinum nanoparticles and thin dielectrics
H Zheng, BK Mahajan, SC Su, S Mukherjee, K Gangopadhyay, ...
Scientific Reports 6 (1), 25234, 2016
182016
Positive Bias Temperature Instability and Hot Carrier Degradation of Back-End-of-Line, nm-Thick, In2O3 Thin-Film Transistors
YP Chen, M Si, BK Mahajan, Z Lin, DY Peide, MA Alam
IEEE Electron Device Letters 43 (2), 232-235, 2021
172021
Enhancing detectivity of indium-oxide-based photodetectors via vertical nanostructuring through glancing angle deposition
A Nath, BK Mahajan, LR Singh, S Vishwas, RK Nanda, MB Sarkar
Journal of Electronic Materials 50, 3722-3730, 2021
152021
Ag Nanoparticles Sheltered In2O3 Nanowire as a Capacitive MOS Memory Device
A Nath, BK Mahajan, MB Sarkar
IEEE Transactions on Nanotechnology 19, 856-863, 2020
122020
A novel ‘IV spectroscopy’technique to deconvolve threshold voltage and mobility degradation in LDMOS transistors
YP Chen, BK Mahajan, D Varghese, S Krishnan, V Reddy, MA Alam
2020 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2020
112020
Improved photo-detection using zigzag TiO2 nanostructures as an active medium
AK Tiwari, A Mondal, BK Mahajan, B Choudhuri, T Goswami, MB Sarkar, ...
Journal of Nanoscience and Nanotechnology 15 (7), 5099-5104, 2015
92015
Hot carrier degradation in classical and emerging logic and power electronic devices: Rethinking reliability for next-generation electronics
MA Alam, BK Mahajan, YP Cheri
2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2021
82021
Self-heating and reliability-aware “intrinsic” safe operating Area of wide bandgap semiconductors—an analytical approach
BK Mahajan, YP Chen, N Zagni, MA Alam
IEEE Transactions on Device and Materials Reliability 21 (4), 518-527, 2021
72021
Quantifying region-specific hot carrier degradation in LDMOS transistors using a novel charge pumping technique
BK Mahajan, YP Chen, D Varghese, V Reddy, S Krishnan, MA Alam
2021 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2021
72021
Super single pulse charge pumping technique for profiling interfacial defects
YP Chen, BK Mahajan, D Varghese, S Krishnan, V Reddy, MA Alam
IEEE Transactions on Electron Devices 68 (2), 726-732, 2021
72021
Design and Optimization of -Ga2O3 on (h-BN layered) Sapphire for High Efficiency Power Transistors: A Device-Circuit-Package Perspective
BK Mahajan, YP Chen, W Ahn, N Zagni, MA Alam
2018 IEEE International Electron Devices Meeting (IEDM), 24.6. 1-24.6. 4, 2018
72018
A junctionless silicon carbide transistor for harsh environment applications
RK Baruah, BK Mahajan, YP Chen, RP Paily
Journal of Electronic Materials 50 (10), 5682-5690, 2021
62021
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