Sunil Dutt
TitleCited byYear
A comparative survey of approximate adders
S Dutt, S Nandi, G Trivedi
2016 26th International Conference Radioelektronika (RADIOELEKTRONIKA), 61-65, 2016
102016
Bit-width-aware constant-delay run-time accuracy programmable adder for error-resilient applications
B Garg, S Dutt, GK Sharma
Microelectronics journal 50, 1-7, 2016
92016
Double-gate FinFET process variation aware 10T SRAM cell topology design and analysis
N Yadav, S Dutt, M Pattnaik, GK Sharma
2013 European Conference on Circuit Theory and Design (ECCTD), 1-4, 2013
82013
Analysis and design of adders for approximate computing
S Dutt, S Nandi, G Trivedi
ACM Transactions on Embedded Computing Systems (TECS) 17 (2), 40, 2018
62018
Exploring approximate computing for yield improvement via re-design of adders for error-resilient applications
S Dutt, H Patel, S Nandi, G Trivedi
2016 29th International Conference on VLSI Design and 2016 15th …, 2016
62016
A new sensitivity-driven process variation aware self-repairing low-power SRAM design
N Yadav, S Dutt, GK Sharma
2014 27th International Conference on VLSI Design and 2014 13th …, 2014
52014
Self-restoring pvt aware independently-controlled gate finfet based 10t sram cell
N Yadav, S Dutt, M Pattnaik, GK Sharma
2013 25th International Conference on Microelectronics (ICM), 1-4, 2013
42013
A high-performance energy-efficient hybrid redundant MAC for error-resilient applications
S Dutt, A Chauhan, R Bhadoriya, S Nandi, G Trivedi
2015 28th International Conference on VLSI Design, 351-356, 2015
32015
Analysis, Modeling and Optimization of Equal Segment Based Approximate Adders
S Dutt, S Dash, S Nandi, G Trivedi
IEEE Transactions on Computers 68 (3), 314-330, 2018
12018
Accuracy enhancement of equal segment based approximate adders
S Dutt, S Nandi, G Trivedi
IET Computers & Digital Techniques 12 (5), 206-215, 2018
2018
Approxhash: delay, power and area optimized approximate hash functions for cryptography applications
S Dutt, B Paul, A Chauhan, S Nandi, G Trivedi
Proceedings of the 10th International Conference on Security of Information …, 2017
2017
Variability-aware parametric yield enhancement via post-silicon tuning of hybrid redundant MAC units
S Dutt, A Chauhan, S Nandi, G Trivedi
VLSI Design, Automation and Test (VLSI-DAT), 1-4, 2015
2015
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