| Single-Event Characterization of Xilinx UltraScale+® MPSOC under Standard and Ultra-High Energy Heavy-Ion Irradiation M Glorieux, A Evans, T Lange, AD In, D Alexandrescu, C Boatella-Polo, ... 2018 IEEE Radiation Effects Data Workshop (REDW), 1-5, 2018 | 25 | 2018 |
| Understanding multidimensional verification: Where functional meets non-functional X Lai, A Balakrishnan, T Lange, M Jenihhin, T Ghasempouri, J Raik, ... Microprocessors and microsystems 71, 102867, 2019 | 17 | 2019 |
| Solar particle event and single event upset prediction from SRAM-based monitor and supervised machine learning J Chen, T Lange, M Andjelkovic, A Simevski, L Lu, M Krstic IEEE Transactions on Emerging Topics in Computing 10 (2), 564-580, 2022 | 16 | 2022 |
| A Novel Error Rate Estimation Approach forUltraScale+ SRAM-based FPGAs L Sterpone, S Azimi, L Bozzoli, B Du, T Lange, M Glorieux, ... 2018 NASA/ESA Conference on Adaptive Hardware and Systems (AHS), 120-126, 2018 | 15 | 2018 |
| Prediction of solar particle events with SRAM-based soft error rate monitor and supervised machine learning J Chen, T Lange, M Andjelkovic, A Simevski, M Krstic Microelectronics Reliability 114, 113799, 2020 | 14 | 2020 |
| Composing graph theory and deep neural networks to evaluate seu type soft error effects A Balakrishnan, T Lange, M Glorieux, D Alexandrescu, M Jenihhin 2020 9th Mediterranean Conference on Embedded Computing (MECO), 1-5, 2020 | 13 | 2020 |
| Machine learning to tackle the challenges of transient and soft errors in complex circuits T Lange, A Balakrishnan, M Glorieux, D Alexandrescu, L Sterpone 2019 IEEE 25th International Symposium on On-Line Testing and Robust System …, 2019 | 12 | 2019 |
| A 500 MHz 16* 16 complex multiplier using self-aligned gate heterostructure FET technology T Akinwande, R MacTaggart, K Betz, D Grider, T Nohava, J Nohava, ... IEEE International Solid-State Circuits Conference, 1989 ISSCC. Digest of …, 1989 | 12 | 1989 |
| Hardware accelerator design with supervised machine learning for solar particle event prediction J Chen, T Lange, M Andjelkovic, A Simevski, M Krstic 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2020 | 11 | 2020 |
| On the estimation of complex circuits functional failure rate by machine learning techniques T Lange, A Balakrishnan, M Glorieux, D Alexandrescu, L Sterpone 2019 49th Annual IEEE/IFIP International Conference on Dependable Systems …, 2019 | 11 | 2019 |
| Modeling gate-level abstraction hierarchy using graph convolutional neural networks to predict functional de-rating factors A Balakrishnan, T Lange, M Glorieux, D Alexandrescu, M Jenihhin 2019 NASA/ESA Conference on Adaptive Hardware and Systems (AHS), 72-78, 2019 | 9 | 2019 |
| Machine learning clustering techniques for selective mitigation of critical design features T Lange, A Balakrishnan, M Glorieux, D Alexandrescu, L Sterpone 2020 IEEE 26th International Symposium on On-Line Testing and Robust System …, 2020 | 8 | 2020 |
| The validation of graph model-based, gate level low-dimensional feature data for machine learning applications A Balakrishnan, T Lange, M Glorieux, D Alexandrescu, M Jenihhin 2019 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and …, 2019 | 8 | 2019 |
| A 500-MHz 16* 16 complex multiplier using self-aligned gate GaAs heterostructure FET technology AI Akinwande, IR MacTaggart, BK Betz, DE Grider, TH Lange, JC Nohava, ... IEEE journal of solid-state circuits 24 (5), 1295-1300, 1989 | 6 | 1989 |
| Functional failure rate due to single-event transients in clock distribution networks T Lange, M Glorieux, D Alexandrescu, L Sterpone 2019 14th International Conference on Design & Technology of Integrated …, 2019 | 5 | 2019 |
| Gate-Level Graph Representation Learning: A Step Towards the Improved Stuck-at Faults Analysis A Balakrishnan, D Alexandrescu, M Jenihhin, T Lange, M Glorieux 2021 22nd International Symposium on Quality Electronic Design (ISQED), 24-30, 2021 | 2 | 2021 |
| On Antagonism Between Side-Channel Security and Soft-Error Reliability in BNN Inference Engines X Lai, T Lange, A Balakrishnan, D Alexandrescu, M Jenihhin 2021 IFIP/IEEE 29th International Conference on Very Large Scale Integration …, 2021 | 1 | 2021 |
| A high performance (Al, Ga) As/GaAs MODFET butterfly adder chip for FFT computation AI Akinwande, BK Betz, IR MacTaggart, DE Grider, DH Narum, TH Lange, ... 11th Annual Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 53-56, 1989 | 1 | 1989 |
| Investigation of the Impact of Angles and Rotation of Low Energy Protons in SRAM Cells Down to 16nm L Artola, M Glorieux, G Hubert, C Inguimbert, T Bonnoit, R Rey, T Lange, ... IEEE Transactions on Nuclear Science, 2024 | | 2024 |
| Representing non-crossing cuts by phylogenetic trees T Lange Electronic Journal of Graph Theory and Applications (EJGTA) 9 (2), 499-505, 2021 | | 2021 |
