| A statistical test suite for random and pseudorandom number generators for cryptographic applications A Rukhin, J Soto, J Nechvatal, M Smid, E Barker Booz-allen and hamilton inc mclean va, 2001 | 2835 | 2001 |
| Sp 800-22 rev. 1a. a statistical test suite for random and pseudorandom number generators for cryptographic applications LE Bassham III, AL Rukhin, J Soto, JR Nechvatal, ME Smid, EB Barker, ... National Institute of Standards & Technology, 2010 | 481 | 2010 |
| Statistical testing of random number generators J Soto Proceedings of the 22nd national information systems security conference 10 …, 1999 | 259 | 1999 |
| Randomness testing of the advanced encryption standard finalist candidates J Soto, L Bassham BOOZ-ALLEN AND HAMILTON INC MCLEAN VA, 2000 | 154 | 2000 |
| Randomness testing of the advanced encryption standard candidate algorithms J Soto, J Soto US Department of Commerce, Technology Administration, National Institute of …, 1999 | 114 | 1999 |
| A survey of state management in big data processing systems QC To, J Soto, V Markl The VLDB Journal 27 (6), 847-872, 2018 | 51 | 2018 |
| NIST special publication 800-22 revision 1a: A statistical test suite for random and pseudorandom number generators for cryptographic applications A Rukhin, J Soto, J Nechvatal, M Smid, E Barker, S Leigh, M Levenson, ... NIST, US Department of Commerce, USA, 2010 | 21 | 2010 |
| Efficient Sample Generation for Scalable Meta Learning S Schelter, J Soto, V Markl, D Burdick, B Reinwald, A Evfimievski IEEE International Conference on Data Engineering (ICDE) 2015, 2015 | 19 | 2015 |
| Large-scale data stream processing systems P Carbone, GE Gévay, G Hermann, A Katsifodimos, J Soto, V Markl, ... Handbook of Big Data Technologies, 219-260, 2017 | 18 | 2017 |
| The limits of image-based optical metrology RM Silver, BM Barnes, R Attota, J Jun, J Filliben, J Soto, M Stocker, ... Metrology, Inspection, and Process Control for Microlithography XX 6152, 61520Z, 2006 | 17 | 2006 |
| Adaptive finite-difference computations of dendritic growth using a phase-field model RJ Braun, BT Murray, J Soto Jr Modelling and Simulation in Materials Science and Engineering 5 (4), 365, 1997 | 15 | 1997 |
| ACSL by Example J Burghardt, J Gerlach, K Hartig, H Pohl, J Soto DEVICE-SOFT project publication. Fraunhofer FIRST Institute, 2010 | 14 | 2010 |
| ACSL by example, towards a verified C standard library J Burghardt, J Gerlach, L Gu, K Hartig, H Pohl, J Soto, K Völlinger DEVICESOFT project publication. Fraunhofer FIRST Institute (December 2011), 2010 | 13 | 2010 |
| A statistical test suite for the validation of cryptographic random number generators A Rukhin, J Soto, J Nechvatal, M Smid, M Levenson, D Banks, M Vangel, ... NIST Computer Security Division/Statistical Engineering Division Internal …, 1999 | 12 | 1999 |
| On fault tolerance for distributed iterative dataflow processing C Xu, M Holzemer, M Kaul, J Soto, V Markl IEEE Transactions on Knowledge and Data Engineering 29 (8), 1709-1722, 2017 | 10 | 2017 |
| Formal specification and automated verification of safety-critical requirements of a railway vehicle with frama-c/jessie K Hartig, J Gerlach, J Soto, J Busse FORMS/FORMAT 2010, 145-153, 2011 | 9 | 2011 |
| Fault-tolerance for distributed iterative dataflows in action C Xu, R Poepsel Lemaitre, J Soto, V Markl Proceedings of the VLDB Endowment 11 (12), 1990-1993, 2018 | 1 | 2018 |
| Towards Streamlined Big Data Analytics A Benczúr, R Pálovics, M Balassi, V Markl, T Rabl, J Soto, B Hovstadius, ... ERCIM News 2016 (107), 31-32, 2016 | 1* | 2016 |
| Open Source Excel Tools for Statistical Metrology for the XVIII IMEKO World Congress HK Liu, WF Guthrie, J Soto XVIII IMEKO WORLD CONGRESS Metrology for a Sustainable Development Rio de …, 2006 | 1 | 2006 |
| Andrew Rukhin, Juan Soto, James Nechvatal, Miles Smid, Elaine Barker, Stefan Leigh, Mark Levenson, Mark Vangel, David Banks A Heckert, J Dray, S Vo NIST Special Publication 800 (22), 22, 2000 | 1 | 2000 |
Sebastian SchelterAssistant Professor at University of AmsterdamVerified email at uva.nl
