| Transition from ripples to faceted structures under low-energy argon ion bombardment of silicon: understanding the role of shadowing and sputtering T Basu, DP Datta, T Som Nanoscale research letters 8, 1-8, 2013 | 60 | 2013 |
| Unusual pattern formation on Si (1 0 0) due to low energy ion bombardment T Basu, JR Mohanty, T Som Applied surface science 258 (24), 9944-9948, 2012 | 43 | 2012 |
| Ultra-violet absorption induced modifications in bulk and nanoscale electrical transport properties of Al-doped ZnO thin films M Kumar, T Basu, T Som Journal of Applied Physics 118 (5), 2015 | 30 | 2015 |
| Thickness-dependent blue shift in the excitonic peak of conformally grown ZnO: Al on ion-beam fabricated self-organized Si ripples T Basu, M Kumar, S Nandy, B Satpati, CP Saini, A Kanjilal, T Som Journal of Applied Physics 118 (10), 2015 | 29 | 2015 |
| Electronic excitation induced defect dynamics in HfO2 based MOS devices investigated by in-situ electrical measurements N Manikanthababu, S Vajandar, N Arun, AP Pathak, K Asokan, ... Applied Physics Letters 112 (13), 2018 | 28 | 2018 |
| Temporal evolution of Ge surface topography under keV ion irradiation: Combined effects of curvature-dependent sputter erosion and atomic redistribution DP Datta, SK Garg, T Basu, B Satpati, H Hofsäss, D Kanjilal, T Som Applied Surface Science 360, 131-142, 2016 | 26 | 2016 |
| Structural, dielectric, electrical properties of Nd doped double perovskite ceramics and variation of density of states upon doping A Ray, T Basu, B Behera, DS Gavali, R Thapa, S Vajandar, T Osipowicz, ... Materials Chemistry and Physics 239, 122250, 2020 | 21 | 2020 |
| Role of Gd-doping in conduction mechanism of BFO-PZO nanocrystalline composites: experimental and first-principles studies A Ray, T Basu, B Behera, M Kumar, R Thapa, P Nayak Journal of Alloys and Compounds 768, 198-213, 2018 | 19 | 2018 |
| Tunable antireflection from conformal Al-doped ZnO films on nanofaceted Si templates T Basu, M Kumar, PK Sahoo, A Kanjilal, T Som Nanoscale Research Letters 9, 1-7, 2014 | 18 | 2014 |
| Radiation tolerance, charge trapping, and defect dynamics studies of ALD-grown Al/HfO2/Si nMOSCAPs N Manikanthababu, T Basu, S Vajandar, SVS Nageswara Rao, ... Journal of Materials Science: Materials in Electronics 31, 3312-3322, 2020 | 17 | 2020 |
| Temporal evolution on SiO2 surface under low energy Ar+-ion bombardment: roles of sputtering, mass redistribution, and shadowing M Kumar, DP Datta, T Basu, SK Garg, H Hofsäss, T Som Journal of Physics: Condensed Matter 30 (33), 334001, 2018 | 17 | 2018 |
| Nanostructures on GaAs surfaces due to 60 keV Ar+-ion beam sputtering V Venugopal, SK Garg, T Basu, OP Sinha, D Kanjilal, SR Bhattacharyya, ... Applied surface science 258 (9), 4144-4147, 2012 | 16 | 2012 |
| Thickness-controlled photoresponsivity of ZnO: Al/Si heterostructures: Role of junction barrier height T Basu, M Kumar, T Som Materials Letters 135, 188-190, 2014 | 15 | 2014 |
| Temporal evolution of ripple pattern on silicon surface: An ion induced solid flow approach T Basu, T Som Applied surface science 310, 142-146, 2014 | 14 | 2014 |
| Surfing silicon nanofacets for cold cathode electron emission sites T Basu, M Kumar, M Saini, J Ghatak, B Satpati, T Som ACS applied materials & interfaces 9 (44), 38931-38942, 2017 | 13 | 2017 |
| Tailoring room temperature photoluminescence of antireflective silicon nanofacets T Basu, M Kumar, A Kanjilal, J Ghatak, PK Sahoo, T Som Journal of Applied Physics 116 (11), 2014 | 13 | 2014 |
| Modification of structural and dielectric properties of polycrystalline Gd-doped BFO–PZO A Ray, B Behera, T Basu, S Vajandar, SK Satpathy, P Nayak Journal of Advanced Dielectrics 8 (05), 1850031, 2018 | 11 | 2018 |
| Effects of ion irradiation on the structural and electrical properties of HfO2/SiON/Si p-metal oxide semiconductor capacitors N Manikanthababu, V Saikiran, T Basu, K Prajna, S Vajandar, AP Pathak, ... Thin Solid Films 682, 156-162, 2019 | 10 | 2019 |
| Prospects in medical applications of terahertz waves A Banerjee, S Vajandar, T Basu Terahertz Biomedical and Healthcare Technologies, 225-239, 2020 | 9 | 2020 |
| Statistical analysis of ripple morphology on Si surfaces due to 60 keV Ar+-ions SK Garg, DP Datta, T Basu, D Kanjilal, T Som Surface Topography: Metrology and Properties 4 (1), 015002, 2015 | 9 | 2015 |
