| Characterization of microroughness parameters in gadolinium oxide thin films: A study based on extended power spectral density analyses M Senthilkumar, NK Sahoo, S Thakur, RB Tokas Applied surface science 252 (5), 1608-1619, 2005 | 135 | 2005 |
| Omnidirectional photonic band gap in magnetron sputtered TiO 2/SiO 2 one dimensional photonic crystal S Jena, RB Tokas, P Sarkar, JS Misal, SM Haque, KD Rao, S Thakur, ... Thin Solid Films 599, 138-144, 2016 | 75 | 2016 |
| Effect of O 2/Ar gas flow ratio on the optical properties and mechanical stress of sputtered HfO 2 thin films S Jena, RB Tokas, JS Misal, KD Rao, DV Udupa, S Thakur, NK Sahoo Thin Solid Films 592, 135-142, 2015 | 63 | 2015 |
| Optical properties and laser damage threshold of HfO 2–SiO 2 mixed composite thin films S Jena, RB Tokas, NM Kamble, S Thakur, NK Sahoo Applied optics 53 (5), 850-860, 2014 | 49 | 2014 |
| Influence of oxygen partial pressure on microstructure, optical properties, residual stress and laser induced damage threshold of amorphous HfO2 thin films S Jena, RB Tokas, S Tripathi, KD Rao, DV Udupa, S Thakur, NK Sahoo Journal of Alloys and Compounds 771, 373-381, 2019 | 47 | 2019 |
| Annealing effects on microstructure and laser-induced damage threshold of HfO 2/SiO 2 multilayer mirrors S Jena, RB Tokas, KD Rao, S Thakur, NK Sahoo Applied Optics 55 (22), 6108-6114, 2016 | 43 | 2016 |
| Tunable mirrors and filters in 1D photonic crystals containing polymers S Jena, RB Tokas, S Thakur, DV Udupa Physica E: Low-dimensional Systems and Nanostructures 114, 113627, 2019 | 38 | 2019 |
| Substrate bias effects during diamond like carbon film deposition by microwave ECR plasma CVD RM Dey, SB Singh, A Biswas, RB Tokas, N Chand, S Venkateshwaran, ... Current Applied Physics 8 (1), 6-12, 2008 | 34 | 2008 |
| Effects of oxygen flow rate on microstructure and optical properties of aluminum oxide films deposited by electron beam evaporation technique N Maiti, A Biswas, RB Tokas, D Bhattacharyya, SN Jha, UP Deshpande, ... Vacuum 85 (2), 214-220, 2010 | 33 | 2010 |
| Determination of the optical constants of HfO 2–SiO 2 composite thin films through reverse fitting of transmission spectra NM Kamble, RB Tokas, A Biswas, S Thakur, D Bhattacharyya, NK Sahoo Vacuum 86 (4), 422-428, 2011 | 30 | 2011 |
| A comparative morphological study of electron beam co-deposited binary optical thin films of HfO 2: SiO 2 and ZrO 2: SiO 2 RB Tokas, NK Sahoo, S Thakur, NM Kamble Current Applied Physics 8 (5), 589-602, 2008 | 30 | 2008 |
| Effect of angle of deposition on micro-roughness parameters and optical properties of HfO 2 thin films deposited by reactive electron beam evaporation RB Tokas, S Jena, S Thakur, NK Sahoo Thin Solid Films 609, 42-48, 2016 | 29 | 2016 |
| A study on threshold voltage stability of low operating voltage organic thin-film transistors N Padma, S Sen, SN Sawant, R Tokas Journal of Physics D: Applied Physics 46 (32), 325104, 2013 | 29 | 2013 |
| Investigation of elastic and optical properties of electron beam evaporated ZrO 2–MgO composite thin films S Jena, RB Tokas, N Kamble, S Thakur, D Bhattacharyya, NK Sahoo Thin Solid Films 537, 163-170, 2013 | 29 | 2013 |
| Study of aging effects on optical properties and residual stress of HfO2 thin film S Jena, RB Tokas, S Thakur, DV Udupa Optik 185, 71-81, 2019 | 27 | 2019 |
| Investigation on the adsorption characteristics of sodium benzoate and taurine on gold nanoparticle film by ATR–FTIR spectroscopy N Kumar, S Thomas, RB Tokas, RJ Kshirsagar Spectrochimica Acta Part A: Molecular and Biomolecular Spectroscopy 118, 614-618, 2014 | 27 | 2014 |
| Study of ZrO2 thin films deposited at glancing angle by radio frequency magnetron sputtering under varying substrate rotation RB Tokas, S Jena, JS Misal, KD Rao, SR Polaki, C Pratap, DV Udupa, ... Thin Solid Films 645, 290-299, 2018 | 24 | 2018 |
| Study of hafnium oxide thin films deposited by RF magnetron sputtering under glancing angle deposition at varying target to substrate distance SM Haque, KD Rao, JS Misal, RB Tokas, DD Shinde, JV Ramana, S Rai, ... Applied Surface Science 353, 459-468, 2015 | 23 | 2015 |
| Electrochemically controlled pitting corrosion in Ni film: A study of AFM and neutron reflectometry S Singh, S Basu, AK Poswal, RB Tokas, SK Ghosh Corrosion Science 51 (3), 575-580, 2009 | 22 | 2009 |
| Optical properties of electron beam evaporated ZrO2:10 %SiO2 thin films: dependence on structure S Jena, RB Tokas, S Thakur, NK Sahoo Indian Journal of Physics 90, 951-957, 2016 | 21 | 2016 |
Shuvendu JenaBhabha Atomic Research CentreVerified email at barc.gov.in
