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G VENUGOPAL RAO
Title
Cited by
Cited by
Year
Iodine-doped polyvinylalcohol using positron annihilation spectroscopy
B Lobo, MR Ranganath, TSGR Chandran, GV Rao, V Ravindrachary, ...
Physical Review B 59 (21), 13693, 1999
651999
Variable low energy positron beams for depth resolved defect spectroscopy in thin film structures
G Amarendra, B Viswanathan, GV Rao, J Parimala, B Purniah
Current Science, 409-417, 1997
511997
Identification of open-volume defects in disordered and amorphized Si: a depth-resolved positron annihilation study
G Amarendra, R Rajaraman, GV Rao, KGM Nair, B Viswanathan, ...
Physical Review B 63 (22), 224112, 2001
372001
Dental implant system
M Verma, N Bhatnagar, A Sood, F Faraz, K Sharma, GV Rao, PS Kumar, ...
US Patent 9,833,300, 2017
352017
Study of defects and strain relaxation in heterostructures using photoluminescence, positron annihilation, and x-ray diffraction
BM Arora, KS Chandrasekaran, MR Gokhale, G Nair, GV Rao, ...
Journal of Applied Physics 87 (12), 8444-8450, 2000
192000
Magnetic properties of RE2Mo2O7 pyrochlores
R Ranganathan, G Rangarajan, R Srinivasan, MA Subramanian, ...
Journal of low temperature physics 52, 481-496, 1983
171983
Silicide formation in Co/Si system investigated by depth-resolved positron annihilation and X-ray diffraction
S Abhaya, GV Rao, S Kalavathi, VS Sastry, G Amarendra
Surface science 600 (13), 2762-2765, 2006
142006
Microstructure, ferromagnetic and photoluminescence properties of ITO and Cr doped ITO nanoparticles using solid state reaction
SH Babu, S Kaleemulla, NM Rao, GV Rao, C Krishnamoorthi
Physica B: Condensed Matter 500, 126-132, 2016
102016
Evidence for excess vacancy defects in the Pd–Si system: positron annihilation, x-ray diffraction and Auger electron spectroscopy study
S Abhaya, G Amarendra, GLN Reddy, R Rajaraman, GV Rao, ...
Journal of Physics: Condensed Matter 15 (46), L713, 2003
92003
Study of inter-diffusion and defect evolution in thin film Al/Ge bilayers using SIMS and positron beam
G Raghavan, GV Rao, G Amarendra, AK Tyagi, B Viswanathan
Applied surface science 178 (1-4), 75-82, 2001
92001
Microstructure and Magnetic Properties of Sn1 − x Ni x O2 Thin Films Prepared by Flash Evaporation Technique
M Kuppan, S Kaleemulla, N Madhusudhana Rao, C Krishnamoorthi, ...
Journal of Superconductivity and Novel Magnetism 30, 981-987, 2017
82017
Study of argon-irradiation-induced defects and amorphization in silicon using a positron beam, Raman spectroscopy and ion channelling
G Amarendra, GV Rao, AK Arora, KGM Nair, TR Ravindran, K Sekar, ...
Journal of Physics: Condensed Matter 11 (30), 5875, 1999
81999
Evaluation of the onset of failure under mechanical and thermal stresses on luting agent for metal–ceramic and metal crowns by finite element analysis
H Agnihotri, N Bhatnagar, GV Rao, V Jain, H Parkash, AK Kar
Contemporary Clinical Dentistry 1 (4), 227-233, 2010
72010
Development of high-rate age-momentum correlation system with a variable-energy pulsed positron beam
R Suzuki, T Ohdaira, T Mikado, G Venugopal Rao
Materials Science Forum 363, 2001
72001
Silicidation in Pd/Si thin film junction—Defect evolution and silicon surface segregation
S Abhaya, G Amarendra, GV Rao, R Rajaraman, BK Panigrahi, VS Sastry
Materials Science and Engineering: B 142 (2-3), 62-68, 2007
62007
Depth profiling of defects in argon irradiated silicon using positron beam facility at Kalpakkam
G Amarendra, G Venugopal Rao, KGM Nair, B Viswanathan
Materials Science Forum 255, 1997
61997
STUDIES ON SOME HIGH Tc SUPERCONDUCTORS
GVS Rao, UV Varadaraju, KA Thomas, R Vijayashree, R Srinivasan, ...
International Journal of Modern Physics B 1 (03n04), 1097-1103, 1987
51987
Helium implanted CuHf as studied by TDPAC and positron lifetime measurements
R Govindaraj, GV Rao, KP Gopinathan, B Viswanathan
Pramana 52, 219-233, 1999
41999
Ferromagnetic resonance in amorphous Fe20Ni60B20
GV Rao, CS Sunandana, AK Bhatnagar
Journal of Physics: Condensed Matter 4 (5), 1373, 1992
41992
Studies on Ge/CeO2 thin film system using positron beam and Raman spectroscopy
GV Rao, G Amarendra, B Viswanathan, S Kanakaraju, S Balaji, S Mohan, ...
Thin solid films 406 (1-2), 250-254, 2002
32002
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