A binary decision diagram based on-line testing of digital vlsi circuits for feedback bridging faults PK Biswal, S Biswas Microelectronics Journal 46 (7), 598-616, 2015 | 9 | 2015 |
A discrete event system approach to on-line testing of digital circuits with measurement limitation PK Biswal, HP Sambho, S Biswas Engineering science and technology, an international journal 19 (3), 1473-1487, 2016 | 7 | 2016 |
A discrete event system approach to online testing of speed independent circuits PK Biswal, K Mishra, S Biswas, HK Kapoor VLSI Design 2015, 5-5, 2015 | 4 | 2015 |
On-line testing of digital vlsi circuits at register transfer level using high level decision diagrams PK Biswal, S Biswas Microelectronics journal 67, 88-100, 2017 | 3 | 2017 |
Timed discrete event system approach to online testing of asynchronous circuits PK Biswal, S Biswas 2015 23rd Mediterranean Conference on Control and Automation (MED), 341-348, 2015 | 3 | 2015 |
A binary decision diagram approach to on-line testing of asynchronous circuits with dynamic and static C-elements PK Biswal, S Biswas Journal of Electronic Testing 35 (5), 715-727, 2019 | 2 | 2019 |
A binary decision diagram approach to on-line testing of asynchronous circuits PK Biswal, S Biswas 2019 32nd International Conference on VLSI Design and 2019 18th …, 2019 | 2 | 2019 |
A polynomial algorithm for diagnosability of fair discrete event systems PK Biswal, S Biswas Systems Science & Control Engineering 3 (1), 307-319, 2015 | 1 | 2015 |
A Flexible Concurrent Testing Scheme for Non-Feedback and Feedback Bridging Faults in Integrated Circuits PK Biswal Journal of Electronic Testing 39 (3), 323-346, 2023 | | 2023 |
A Concurrent Testing Scheme for Muller Circuits Using Reduced Ordered Binary Decision Diagram PK Biswal 2022 IEEE Region 10 Symposium (TENSYMP), 1-6, 2022 | | 2022 |
Decision diagrams based on line testing of digital vlsi circuits PK Biswal Guwahati, 2017 | | 2017 |
Diagnosability in stochastic Petri Net based DES models PK Biswal, S Biswas 22nd Mediterranean Conference on Control and Automation, 434-439, 2014 | | 2014 |