| Modeling process variability in scaled CMOS technology SK Saha IEEE Design & Test of Computers 27 (2), 8-16, 2010 | 200 | 2010 |
| Semiconductor structure having two levels of buried regions DR Farrenkopf, RB Merrill, S Saha, KE Brehmer, K Gadepally, ... US Patent 5,889,315, 1999 | 188 | 1999 |
| Fabrication of semiconductor structure having two levels of buried regions DR Farrenkopf, RB Merrill, S Saha, KE Brehmer, K Gadepally, ... US Patent 5,899,714, 1999 | 166 | 1999 |
| Systems and methods of non-volatile memory sensing including selective/differential threshold voltage features H Van Tran, S Saha US Patent 8,385,147, 2013 | 114 | 2013 |
| Compact MOSFET Modeling for Process Variability-Aware VLSI Circuit Design SK Saha IEEE Access 2, 104-115, 2014 | 101 | 2014 |
| MOSFET test structures for two-dimensional device simulation S Saha Solid-state electronics 38 (1), 69-73, 1995 | 78 | 1995 |
| Subthreshold analog/RF performance enhancement of underlap DG FETs with high-k spacer for low power applications K Koley, A Dutta, B Syamal, SK Saha, CK Sarkar IEEE Transactions on Electron Devices 60 (1), 63-69, 2012 | 67 | 2012 |
| Compact Models for Integrated Circuit Design: Conventional Transistors and Beyond SK Saha CRC Press, Taylor & Francis Group, 2015 | 59 | 2015 |
| Design considerations for sub-90-nm split-gate flash-memory cells SK Saha IEEE Transactions on Electron Devices 54 (11), 3049-3055, 2007 | 55 | 2007 |
| Technology computer aided design C Sarkar CRC Press, 2018 | 49 | 2018 |
| Analysis of High-Spacer Asymmetric Underlap DG-MOSFET for SOC Application K Koley, A Dutta, SK Saha, CK Sarkar IEEE Transactions on Electron Devices 62 (6), 1733-1738, 2015 | 45 | 2015 |
| Design considerations for 25 nm MOSFET devices S Saha Solid-State Electronics 45 (10), 1851-1857, 2001 | 45 | 2001 |
| Efficient III-Nitride MIS-HEMT devices with high-κ gate dielectric for high-power switching boost converter circuits A Mohanbabu, N Mohankumar, DG Raj, P Sarkar, SK Saha Superlattices and Microstructures 103, 270-284, 2017 | 44 | 2017 |
| Scaling considerations for high performance 25 nm metal–oxide–semiconductor field effect transistors S Saha Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2001 | 36 | 2001 |
| Impact ionization rate of electrons for accurate simulation of substrate current in submicron devices S Saha, CS Yeh, B Gadepally Solid-state electronics 36 (10), 1429-1432, 1993 | 36 | 1993 |
| Managing technology CAD for competitive advantage: An efficient approach for integrated circuit fabrication technology development SK Saha IEEE Transactions on Engineering Management 46 (2), 221-229, 1999 | 35 | 1999 |
| Introduction to technology computer aided design SK Saha Technology Computer Aided Design, 17-60, 2018 | 31 | 2018 |
| Effects of inversion layer quantization on channel profile engineering for nMOSFETs with 0.1 μm channel lengths S Saha Solid-State Electronics 42 (11), 1985-1991, 1998 | 30 | 1998 |
| FinFET Devices for VLSI Circuits and Systems SK Saha CRC Press Taylor and Francis Group, 2020 | 27 | 2020 |
| Emerging business trends in the semiconductor industry SK Saha 2013 Proceedings of PICMET'13: Technology Management in the IT-Driven …, 2013 | 25 | 2013 |
