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Sergey NikishinProfessor of Electrical Engineering, Texas Tech UniversityVerified email at ttu.edu
Ayrton BernussiProfessor of Electrical and Computer EngineeringVerified email at ttu.edu
Zhaoyang FanProfessor of Electrical Engineering, Arizona State UniversityVerified email at asu.edu
M.NazariVisiting Scholar, Texas State UniversityVerified email at txstate.edu
Sandeep Sohal, PhDSenior Reliability Engineer, Infinera CorporationVerified email at infinera.com
Yong Zhao, Ph.D.View, Inc.Verified email at viewglass.com
yanhan zhuIntel Corp.Verified email at intel.com
Edwin PinerProfessor, Texas State UniversityVerified email at txstate.edu
shubhra gangopadhyayProfessor of Electrical EngineeringVerified email at missouri.edu
D. H. S. MaithripalaUniversity of Peradeniya, Sri LankaVerified email at eng.pdn.ac.lk
Stefan ZollnerNew Mexico State UniversityVerified email at nmsu.edu
Iulian GherasoiuSUNY Polytechnic InstituteVerified email at sunyit.edu
R ZallenProfessor of Physics, Virginia TechVerified email at vt.edu
Gulten KARAOGLAN-BEBEKIntelVerified email at intel.com
Luis Grave de PeraltaProfessor of Physics, Texas Tech UniversityVerified email at ttu.edu
Xuan PanPhD of Electrical Engineering, Nano Tech Center, Texas Tech UniversityVerified email at ttu.edu
Dan FeketeProfessor of Physics, Physics Dept., TechnionVerified email at tx.technion.ac.il
Greg M. SwainProfessor of Chemistry, Michigan State UniversityVerified email at chemistry.msu.edu
Purnendu DasguptaUniversity of Texas at ArlingtonVerified email at uta.edu
Louisa Hope-WeeksTexas Tech UniversityVerified email at ttu.edu