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Maxim Ryabko
Maxim Ryabko
NanoPhotonics Lab lead at Samsung R&D Moscow
Verified email at samsung.com
Title
Cited by
Cited by
Year
Narrow-linewidth lasing and soliton Kerr microcombs with ordinary laser diodes
NG Pavlov, S Koptyaev, GV Lihachev, AS Voloshin, AS Gorodnitskiy, ...
Nature Photonics 12 (11), 694-698, 2018
2222018
Interferometric fiber-optic electric current sensor for industrial application
NI Starostin, MV Ryabko, YK Chamorovskii, VP Gubin, AI Sazonov, ...
Key Engineering Materials 437, 314-318, 2010
302010
Method for optical inspection of nanoscale objects based upon analysis of their defocused images and features of its practical implementation
MV Ryabko, SN Koptyaev, AV Shcherbakov, AD Lantsov, SY Oh
Optics Express 21 (21), 24483-24489, 2013
232013
Miniature microstructured fiber coil with high magneto-optical sensitivity
YK Chamorovskiy, NI Starostin, MV Ryabko, AI Sazonov, SK Morshnev, ...
Optics Communications 282 (23), 4618-4621, 2009
222009
Through-focus scanning optical microscopy (TSOM) considering optical aberrations: practical implementation
M Ryabko, A Shchekin, S Koptyaev, A Lantsov, A Medvedev, ...
Optics Express 23 (25), 32215-32221, 2015
212015
Motion-free all optical inspection system for nanoscale topology control
M Ryabko, S Koptyaev, A Shcherbakov, A Lantsov, SY Oh
Optics Express 22 (12), 14958-14963, 2014
182014
Hybrid integrated dual-microcomb source
NY Dmitriev, SN Koptyaev, AS Voloshin, NM Kondratiev, KN Min’kov, ...
Physical Review Applied 18 (3), 034068, 2022
162022
Measuring of an embedded linear birefringence in spun optical fibers
SK Morshnev, MV Ryabko, YK Chamorovskii
Lasers for Measurements and Information Transfer 2006 6594, 235-243, 2007
152007
Optical measurement system and method for measuring critical dimension of nanostructure
SN Koptyaev, MV Ryabko, MN Rychagov
US Patent 9,360,662, 2016
112016
Spun microstructured optical fibresfor Faraday effect current sensors
YK Chamorovsky, NI Starostin, SK Morshnev, VP Gubin, MV Ryabko, ...
Quantum Electronics 39 (11), 1074, 2009
112009
Микроструктурное оптическое spun-волокно для датчиков тока на основе эффекта Фарадея
ЮК Чаморовский, НИ Старостин, СК Моршнев, ВП Губин, МВ Рябко, ...
Квантовая электроника 39 (11), 1074-1077, 2009
102009
Fiber optic current sensor
Y Chamorovskiy, V Gubin, S Morshnev, Y Prziyalkovskiy, M Ryabko, ...
US Patent 8,624,579, 2014
92014
Polarization dispersion in microstructure fibers with side channels
MV Ryabko, VA Isaev, YK Chamorovskiĭ, SA Nikitov
Optics and Spectroscopy 102, 112-117, 2007
92007
Method and device for measuring critical dimension of nanostructure
AV Shcherbakov, MV Riabko, AD Lantsov
US Patent 9,400,254, 2016
72016
Optical measuring system and method of measuring critical size
SN Koptyaev, MV Ryabko, AV Shcherbakov, AD Lantsov
US Patent 9,322,640, 2016
72016
Optical dual-comb source apparatuses including optical microresonator
SN Koptyaev, GV Lihachev, NG Pavlov, AA Shchekin, IA Bilenko, ...
US Patent 10,224,688, 2019
52019
Improved critical dimension inspection for the semiconductor industry
M Ryabko, S Koptyev, A Shchekin, A Medvedev
SPIE Newsroom 5515, 2014
42014
ПОЛЯРИЗАЦИОННАЯ ДИСПЕРСИЯ В МИКРОСТРУКТУРНЫХ ВОЛОКНАХ С БОКОВЫМИ КАНАЛАМИ
МВ Рябко, ВА Исаев, ЮК Чаморовский, СА Никитов
Оптика и спектроскопия 102 (1), 122-127, 2007
42007
Visible upconversion luminescence of doped bulk silicon for a multimodal wafer metrology
BI Afinogenov, AN Sofronov, IM Antropov, NR Filatov, AS Medvedev, ...
Optics Letters 46 (13), 3071-3074, 2021
32021
Apparatus for and method of measuring blood pressure
B Chanwook, J Kyoung, MV Riabko, Y Yoon, AD Lantsov, ...
US Patent 10,405,806, 2019
32019
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