| Infrared photocarrier radiometry of semiconductors: Physical principles, quantitative depth profilometry, and scanning imaging of deep subsurface electronic defects A Mandelis, J Batista, D Shaughnessy Physical Review B 67 (20), 205208, 2003 | 192 | 2003 |
| Temperature dependence of carrier mobility in Si wafers measured by infrared photocarrier radiometry J Batista, A Mandelis, D Shaughnessy Applied Physics Letters 82 (23), 4077-4079, 2003 | 115 | 2003 |
| Temperature dependent behavior of single walled MoO3 nanotubes: A Raman spectroscopy study JV Silveira, JA Batista, GD Saraiva, J Mendes Filho, AG Souza Filho, S Hu, ... Vibrational Spectroscopy 54 (2), 179-183, 2010 | 59 | 2010 |
| Accuracy of photocarrier radiometric measurement of electronic transport properties of ion-implanted silicon wafers B Li, D Shaughnessy, A Mandelis, J Batista, J Garcia Journal of applied physics 96 (1), 186-196, 2004 | 47 | 2004 |
| Three-layer photocarrier radiometry model of ion-implanted silicon wafers B Li, D Shaughnessy, A Mandelis, J Batista, J Garcia Journal of applied physics 95 (12), 7832-7840, 2004 | 42 | 2004 |
| Ion implant dose dependence of photocarrier radiometry at multiple excitation wavelengths D Shaughnessy, B Li, A Mandelis, J Batista Applied physics letters 84 (25), 5219-5221, 2004 | 33 | 2004 |
| Functionalization of single-wall carbon nanotubes through chloroform adsorption: theory and experiment EC Girão, Y Liebold-Ribeiro, JA Batista, EB Barros, SB Fagan, ... Physical Chemistry Chemical Physics 12 (7), 1518-1524, 2010 | 24 | 2010 |
| Deep subsurface electronic defect image contrast and resolution amplification in Si wafers using infrared photocarrier radiometry J Batista, A Mandelis, D Shaughnessy, B Li Applied physics letters 85 (10), 1713-1715, 2004 | 22 | 2004 |
| Photothermal and electroreflectance images of biased metal-oxide-semiconductor field-effect transistors: Six different kinds of subsurface microscopy JA Batista, AM Mansanares, EC Da Silva, D Fournier Journal of applied physics 82 (1), 423-426, 1997 | 21 | 1997 |
| Contrast and sensitivity enhancement in photothermal reflectance microscopy through the use of specific probing wavelengths: applications to microelectronics JA Batista, D Takeuti, AM Mansanares, EC SILVA Analytical Sciences/Supplements 17 (0), s73-s75, 2002 | 20 | 2002 |
| Two-beam cross-modulation photocarrier radiometry: principles and contrast amplification in semiconductor subsurface imaging D Shaughnessy, A Mandelis, J Batista, J Tolev, B Li Semiconductor science and technology 21 (3), 320, 2006 | 16 | 2006 |
| Method of photocarrier radiometry of semiconductors A Mandelis, D Shaughnessy, JA Batista, JA Garcia US Patent 7,045,786, 2006 | 15 | 2006 |
| Noncontacting laser photocarrier radiometric depth profilometry of harmonically modulated band bending in the space-charge layer at doped SiO2‐Si interfaces A Mandelis, J Batista, J Gibkes, M Pawlak, J Pelzl Journal of applied physics 97 (8), 2005 | 14 | 2005 |
| Contrast enhancement in the detection of defects in transparent layered structures: The use of optothermal interference technique in solar cell investigation JA Batista, AM Mansanares, EC Da Silva, CC Vaz, LCM Miranda Journal of Applied Physics 88 (9), 5079-5086, 2000 | 14 | 2000 |
| Subsurface microscopy of biased metal-oxide-semiconductor field-effect-transistor structures: photothermal and electroreflectance images JA Batista, AM Mansanares, EC Da Silva, MBC Pimentel, N Jannuzzi, ... Sensors and Actuators A: Physical 71 (1-2), 40-45, 1998 | 14 | 1998 |
| Thermoreflectance microscopy applied to the study of electrostatic discharge degradation in metal-oxide-semiconductor field-effect transistors LR de Freitas, EC da Silva, AM Mansanares, MBC Pimentel, ... Journal of applied physics 97 (10), 2005 | 5 | 2005 |
| Shaughnessy D 2003 Phys. Rev. B 67 205208 [9] Li B C, Shaughnessy D, Mandelis A A Mandelis, J Batista J. Appl. Phys. 2005, 97, 2005 | 4 | 2005 |
| Photocarrier radiometry of ion implanted semiconductors D Shaughnessy, B Li, A Mandelis, J Batista, J Tolev Journal de Physique IV (Proceedings) 125, 447-449, 2005 | 3 | 2005 |
| Laser thermoreflectance temperature measurements of metal coating alloys on a rotating platform Y Liu, M Choy, A Mandelis, J Batista, B Li Journal de Physique IV (Proceedings) 125, 601-604, 2005 | 3 | 2005 |
| Laser-based measurements of temperature dependence of carrier mobility and lifetime in Si wafers using photocarrier radiometry J Batista, A Mandelis, D Shaughnessy Journal de Physique IV (Proceedings) 125, 443-445, 2005 | 2 | 2005 |
