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Chetan Kumar Dabhi
Chetan Kumar Dabhi
Other namesChetan K Dabhi, C K Dabhi
Verified email at berkeley.edu - Homepage
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Cited by
Cited by
Year
Impact of variability on processor performance in negative capacitance finfet technology
H Amrouch, G Pahwa, AD Gaidhane, CK Dabhi, F Klemme, O Prakash, ...
IEEE Transactions on Circuits and Systems I: Regular Papers 67 (9), 3127-3137, 2020
642020
A simulation study of nbti impact on 14-nm node finfet technology for logic applications: Device degradation to circuit-level interaction
S Mishra, H Amrouch, J Joe, CK Dabhi, K Thakor, YS Chauhan, J Henkel, ...
IEEE Transactions on Electron Devices 66 (1), 271-278, 2018
592018
Transistor self-heating: The rising challenge for semiconductor testing
O Prakash, CK Dabhi, YS Chauhan, H Amrouch
2021 IEEE 39th VLSI Test Symposium (VTS), 1-7, 2021
342021
Device to circuit framework for activity-dependent nbti aging in digital circuits
A Thirunavukkarasu, H Amrouch, J Joe, N Goel, N Parihar, S Mishra, ...
IEEE Transactions on Electron Devices 66 (1), 316-323, 2018
322018
Subthermionic negative capacitance ion sensitive field-effect transistor
F Bellando, CK Dabhi, A Saeidi, C Gastaldi, YS Chauhan, AM Ionescu
Applied Physics Letters 116 (17), 2020
282020
Impact of self-heating on negative-capacitance finfet: Device-circuit interaction
O Prakash, G Pahwa, CK Dabhi, YS Chauhan, H Amrouch
IEEE Transactions on Electron Devices 68 (4), 1420-1424, 2021
252021
Compact modeling of negative-capacitance FDSOI FETs for circuit simulations
CK Dabhi, SS Parihar, A Dasgupta, YS Chauhan
IEEE Transactions on Electron Devices 67 (7), 2710-2716, 2020
212020
Compact modeling of temperature-dependent gate-induced drain leakage including low-field effects
CK Dabhi, AS Roy, YS Chauhan
IEEE Transactions on Electron Devices 66 (7), 2892-2897, 2019
202019
Ferroelectric fdsoi fet modeling for memory and logic applications
S Chatterjee, S Kumar, A Gaidhane, CK Dabhi, YS Chauhan, H Amrouch
Solid-State Electronics 200, 108554, 2023
172023
BSIM4. 6.4 MOSFET Model: User’s Manual
C Hu, AM Nikenjad, W Yang, D Lu
UC Berkeley, 2009
142009
NBTI-related variability impact on 14-nm node FinFET SRAM performance and static power: Correlation to time zero fluctuations
S Mishra, N Parihar, R Anandkrishnan, CK Dabhi, YS Chauhan, ...
IEEE Transactions on Electron Devices 65 (11), 4846-4853, 2018
132018
A unified flicker noise model for FDSOI MOSFETs including back-bias effect
P Kushwaha, H Agarwal, CK Dabhi, YK Lin, JP Duarte, C Hu, ...
2018 IEEE International Conference on Electronics, Computing and …, 2018
122018
Novel fdsoi-based dynamic xnor logic for ultra-dense highly-efficient computing
S Kumar, S Chatterjee, CK Dabhi, H Amrouch, YS Chauhan
2022 IEEE International Symposium on Circuits and Systems (ISCAS), 3373-3377, 2022
92022
BSIM4 4.8. 1 MOSFET model
CK Dabhi, A Dasgupta, H Agrawal, N Paydavosi
Dept. Elect. Eng. Comput. Sci., Univ. California, Berkeley, CA, Tech. Rep …, 2017
92017
Symmetric BSIM-SOI—Part I: A Compact Model for Dynamically Depleted SOI MOSFETs
CK Dabhi, D Rajasekharan, G Pahwa, D Nandi, N Karumuri, ...
IEEE Transactions on Electron Devices, 2024
72024
Underlap channel silicon-on-insulator quantum dot floating-gate MOSFET for low-power memory applications
CT Dabhi, GC Patil
Journal of Computational Electronics 15 (4), 1563-1569, 2016
72016
Nontraditional design of dynamic logics using FDSOI for ultra-efficient computing
S Kumar, S Chatterjee, CK Dabhi, YS Chauhan, H Amrouch
IEEE Journal on Exploratory Solid-State Computational Devices and Circuits 9 …, 2023
62023
Modeling of induced gate thermal noise including back-bias effect in FDSOI MOSFET
CK Dabhi, A Dasgupta, P Kushwaha, H Agarwal, C Hu, YS Chauhan
IEEE Microwave and Wireless Components Letters 28 (7), 597-599, 2018
62018
Compact modeling of emerging IC devices for technology-design co-development
G Pahwa, A Dasgupta, CT Tung, MY Kao, CK Dabhi, S Sarker, ...
2022 International Electron Devices Meeting (IEDM), 8.1. 1-8.1. 4, 2022
52022
Anomalous GIDL effect with back bias in FinFET: Physical insights and compact modeling
CK Dabhi, AS Roy, L Yang, YS Chauhan
IEEE Transactions on Electron Devices 68 (7), 3261-3267, 2021
52021
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