Thomas M. Moore
Title
Cited by
Cited by
Year
Method for sample separation and lift-out with one cut
TM Moore, RD Kruger, C Hartfield
US Patent 6,420,722, 2002
1452002
Total release method for sample extraction from a charged-particle instrument
TM Moore
US Patent 6,570,170, 2003
712003
The impact of delamination on stress-induced and contamination-related failure in surface mount ICs
TM Moore, SJ Kelsall
Proceedings of the International Reliability Physics Symposium, 169-176, 1992
441992
Characterization of integrated circuit packaging materials
T Moore
Elsevier, 2013
362013
Method for STEM sample inspection in a charged particle beam instrument
L Zaykova-Feldman, TM Moore, G Amador, M Hammer
US Patent 7,834,315, 2010
302010
Method for STEM sample inspection in a charged particle beam instrument
L Zaykova-Feldman, TM Moore, G Amador, M Hammer
US Patent 7,834,315, 2010
302010
C-mode acoustic microscopy applied to integrated circuit package inspection
TM Moore
Solid-state electronics 35 (3), 411-421, 1992
301992
Correlation of surface mount plastic package reliability testing to nondestructive inspection by scanning acoustic microscopy
TM Moore, R McKenna, SJ Kelsall
29th Annual Proceedings Reliability Physics 1991, 160-166, 1991
291991
Method and apparatus for in-situ probe tip replacement inside a charged particle beam microscope
TM Moore, L Zaykova-Feldman
US Patent 7,381,971, 2008
282008
Method and apparatus for the automated process of in-situ lift-out
TM Moore, L Zaykova-Feldman
US Patent 7,414,252, 2008
262008
FIB lift-out for defect analysis
LA Giannuzzi, BW Kempshall, SD Anderson, BI Prenitzer, TM Moore
Analysis Techniques of Submicron Defects 2002, 29-35, 2002
262002
Laser-Assisted Focused He+ Ion Beam Induced Etching with and without XeF2 Gas Assist
MG Stanford, K Mahady, BB Lewis, JD Fowlkes, S Tan, R Livengood, ...
ACS applied materials & interfaces 8 (42), 29155-29162, 2016
242016
Topical administration of pharmacologically active bases in the treatment of warts
HI Maibach, EC Luo, TM Hsu
US Patent 6,821,523, 2004
222004
Identification of package defects in plastic-packaged surface-mount ICs by scanning acoustic microscopy
TM Moore
ISTFA 89, 61-67, 1989
221989
In situ laser processing in a scanning electron microscope
NA Roberts, GA Magel, CD Hartfield, TM Moore, JD Fowlkes, PD Rack
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 30 (4 …, 2012
212012
Method and apparatus for acquiring simultaneous and overlapping optical and charged particle beam images
TM Moore, C Hartfield, GA Magel
US Patent 8,440,969, 2013
202013
TEM sample holder
TM Moore
US Patent 7,115,882, 2006
202006
EBIC characterization of electrically active defects in (Hg, Cd) Te
TM Moore, HF Schaake
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 1 (3 …, 1983
201983
Method for manipulating microscopic particles and analyzing
TM Moore, JM Anthony
US Patent 6,777,674, 2004
182004
Method for manipulating microscopic particles and analyzing
TM Moore, JM Anthony
US Patent 6,777,674, 2004
182004
The system can't perform the operation now. Try again later.
Articles 1–20