Rajpal S. Sirohi
Rajpal S. Sirohi
University of Tezpur, Assam, India
Verified email at rose-hulman.edu
TitleCited byYear
Speckle metrology
RS Sirohi
Marcel Dekker, 1993
5301993
Optical methods of measurement: wholefield techniques
R Sirohi
CRC Press, 2009
1862009
Single-slit diffraction of an optical beam with phase singularity
DP Ghai, P Senthilkumaran, RS Sirohi
Optics and Lasers in Engineering 47 (1), 123-126, 2009
1012009
Use of spatial phase shifting technique in digital speckle pattern interferometry (DSPI) and digital shearography (DS)
B Bhaduri, NK Mohan, MP Kothiyal, RS Sirohi
Optics express 14 (24), 11598-11607, 2006
962006
Double wedge plate shearing interferometer for collimation test
RS Sirohi, MP Kothiyal
Applied optics 26 (19), 4054-4056, 1987
871987
Characterization of surface topography by confocal microscopy: I. Principles and the measurement system
G Udupa, M Singaperumal, RS Sirohi, MP Kothiyal
Measurement Science and Technology 11 (3), 305, 2000
862000
Electrochemical ellipsometric study of gold
RS Sirohi, MA Genshaw
Journal of The Electrochemical Society 116 (7), 910-914, 1969
861969
Achromatic phase shifting by a rotating polarizer
SS Helen, MP Kothiyal, RS Sirohi
Optics Communications 154 (5-6), 249-254, 1998
851998
Improved collimation testing using Talbot interferometry
MP Kothiyal, RS Sirohi
Applied optics 26 (19), 4056-4057, 1987
741987
Optical components, systems, and measurement techniques
RS Sirohi, MP Kothiyal
M. Dekker, 1990
651990
Techniques of displacement and deformation measurements in speckle metrology
PK Rastogi
OPTICAL ENGINEERING-NEW YORK-MARCEL DEKKER INCORPORATED- 38, 41-41, 1993
621993
Simultaneous measurement of slope and curvature with a three-aperture speckle shearing interferometer
DK Sharma, RS Sirohi, MP Kothiyal
Applied optics 23 (10), 1542-1546, 1984
571984
Speckle methods in experimental mechanics
RS Sirohi
OPTICAL ENGINEERING-NEW YORK-MARCEL DEKKER INCORPORATED- 38, 99-99, 1993
561993
Improved techniques of collimation testing
MP Kothiyal, RS Sirohi, KJ Rosenbruch
Optics & Laser Technology 20 (3), 139-144, 1988
561988
Spatial phase shifting for pure in-plane displacement and displacement-derivative measurements in electronic speckle pattern interferometry (ESPI)
RS Sirohi, J Burke, H Helmers, KD Hinsch
Applied optics 36 (23), 5787-5791, 1997
551997
Measurement of focal length with phase-shifting Talbot interferometry
P Singh, MS Faridi, C Shakher, RS Sirohi
Applied optics 44 (9), 1572-1576, 2005
542005
Characterization of surface topography by confocal microscopy: II. The micro and macro surface irregularities
G Udupa, M Singaperumal, RS Sirohi, MP Kothiyal
Measurement Science and Technology 11 (3), 315, 2000
492000
Direct determination of focal length by using Talbot interferometry
KV Sriram, MP Kothiyal, RS Sirohi
Applied optics 31 (28), 5984-5987, 1992
461992
Surface fluctuation scattering using grating heterodyne spectroscopy
RV Edwards, RS Sirohi, JA Mann, LB Shih, L Lading
Applied optics 21 (19), 3555-3568, 1982
451982
Real-time comparative digital speckle pattern interferometry
AR Ganesan, C Joenathan, RS Sirohi
Optics communications 64 (6), 501-506, 1987
431987
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