Jimmie Miller
Jimmie Miller
UNC Charlotte Center for Precision Metrology
Verified email at uncc.edu - Homepage
Cited by
Cited by
Development of a parametric model and virtual machine to estimate task specific measurement uncertainty for a five-axis multi-sensor coordinate measuring machine
P Ramu, JA YagŁe, RJ Hocken, J Miller
Precision Engineering 35 (3), 431-439, 2011
X-ray calibrated tunneling system utilizing a dimensionally stable nanometer positioner
JA Miller, R Hocken, ST Smith, S Harb
Precision engineering 18 (2), 95-102, 1996
A technique for enhancing machine tool accuracy by transferring the metrology reference from the machine tool to the workpiece
BA Woody, KS Smith, RJ Hocken, JA Miller
Journal of manufacturing science and engineering 129 (3), 636-643, 2007
Approach for uncertainty analysis and error evaluation of four-axis co-ordinate measuring machines
JB de Aquino Silva, RJ Hocken, JA Miller, GW Caskey, P Ramu
The International Journal of Advanced Manufacturing Technology 41 (11), 1130†…, 2009
Improving the accuracy of large scale monolithic parts using fiducials
S Smith, BA Woody, JA Miller
CIRP Annals-Manufacturing Technology 54 (1), 483-486, 2005
Scanning tunneling microscopy bit making on highly oriented pyrolytic graphite: Initial results
JA Miller, RJ Hocken
Journal of applied physics 68 (2), 905-907, 1990
Accurate measurement of trivalent silicon interface trap density using small signal steady‐state methods
JA Miller, C Blat, EH Nicollian
Journal of applied physics 66 (2), 716-721, 1989
Application of cat's-eye retroreflector in micro-displacement measurement
D Ren, KM Lawton, JA Miller
Precision engineering 31 (1), 68-71, 2007
Nanotechnology and its impact on manufacturing
RJ Hocken, JA Miller
Tokyo: Japan/USA Symposium on Flexible Auto-mation 15, 1993
A double-pass interferometer for measurement of dimensional changes
D Ren, KM Lawton, JA Miller
Measurement Science and Technology 19 (2), 025303, 2008
Fiducial calibration systems and methods for manufacturing, inspection, and assembly
JA Miller
US Patent 6,782,596, 2004
Fiducial calibration systems and methods for manufacturing, inspection, and assembly
J Miller
US Patent App. 10/007,051, 2002
Error mapping of rotary tables in 4-axis measuring devices using a ball plate artifact
Q Wang, J Miller, A Von Freyberg, N Steffens, A Fischer, G Goch
CIRP Annals 67 (1), 559-562, 2018
Low temperature epitaxial growth of Ge using electron‐cyclotron‐resonance plasma‐assisted chemical vapor deposition
WJ Varhue, JM Carulli, GG Peterson, JA Miller
Journal of applied physics 71 (4), 1949-1954, 1992
Fiducial calibration method and system for assembling parts
JA Miller
US Patent 7,073,239, 2006
Fiducial calibration systems and methods for manufacturing, inspection, and assembly
J Miller
US Patent App. 10/877,528, 2004
Effective stylus diameter determination using near zero-width reference
J Miller, S Dutta, E Morse, J Yague-Fabra
Precision Engineering 35 (3), 500-504, 2011
Fiducial calibration method for measuring a workpiece
JA Miller
US Patent 7,065,851, 2006
In-Situ Infrared(IR) Detection and Heating of the High Pressure Phase of Silicon during Scratching Test
L Dong, JA Patten, JA Miller
Surface Engineering 2004--Fundamentals and Applications, 271-276, 2005
In-situ infrared detection and heating of metallic phase of silicon during scratching test
L Dong, JA Patten, JA Miller
International journal of manufacturing technology and management 7 (5-6†…, 2005
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