| NMR, DSC, DMA, and high pressure electrical conductivity studies in PPO complexed with sodium perchlorate SG Greenbaum, YS Pak, MC Wintersgill, JJ Fontanella, JW Schultz, ... Journal of the Electrochemical Society 135 (1), 235, 1988 | 94 | 1988 |
| Focused beam methods: measuring microwave materials in free space JW Schultz John Schultz, 2012 | 91 | 2012 |
| Photopolymerization of nematic liquid crystal monomers for structural applications: molecular order and orientation dynamics JW Schultz, RP Chartoff Polymer 39 (2), 319-325, 1998 | 40 | 1998 |
| Dielectric spectroscopy in analysis of polymers JW Schultz Encyclopedia of Analytical Chemistry: Applications, Theory and Instrumentation, 2006 | 32 | 2006 |
| Novel liquid crystal resins for stereolithography–processing parameters and mechanical analysis JS Ullett, JW Schultz, RP Chartoff Rapid prototyping journal 6 (1), 8-17, 2000 | 23 | 2000 |
| Photopolymerization of nematic liquid crystal monomers for structural applications: Linear viscoelastic behavior and cure effects JW Schultz, RP Chartoff, JS Ullett Journal of Polymer Science Part B: Polymer Physics 36 (6), 1081-1089, 1998 | 21 | 1998 |
| Limited streamer tubes for the OPAL hadron calorimeter G Artusi, L Biffoni, S Bimbi, P Capiluppi, L Degli Esposti, MM Deninno, ... Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 1989 | 19 | 1989 |
| A comparison of material measurement accuracy of RF spot probes to a lens-based focused beam system JW Schultz, J Maloney, K Maloney, R Schultz Proc. 2014 AMTA Symposium, 2014 | 18 | 2014 |
| Polymerization and viscoelastic behavior of networks from a dual‐curing, liquid crystalline monomer JW Schultz, J Bhatt, RP Chartoff, RT Pogue, JS Ullett Journal of Polymer Science Part B: Polymer Physics 37 (11), 1183-1190, 1999 | 17 | 1999 |
| Thermal-expansion and fracture toughness properties of parts made from liquid crystal stereolithography resins JS Ullett, T Benson-Tolle, JW Schultz, RP Chartoff Materials & design 20 (2-3), 91-97, 1999 | 17 | 1999 |
| Impedance response and modeling of composites containing aligned semiconductor whiskers: Effects of dc-bias partitioning and percolated-cluster length, topology, and filler … BD Bertram, RA Gerhardt, JW Schultz Journal of Applied Physics 111 (12), 2012 | 16 | 2012 |
| Fragmented aperture antenna design of miniaturized GPS CRPA: model and measurements JG Maloney, BN Baker, JJ Acree, JW Schultz, JA Little, DD Reuster 2007 IEEE Antennas and Propagation Society International Symposium, 3784-3787, 2007 | 15 | 2007 |
| Method and apparatus for stereolithography RP Chartoff, JW Schultz, JS Ullett US Patent 6,117,385, 2000 | 13 | 2000 |
| Extruded and Pressureless‐Sintered Al2O3–SiCw Composite Rods: Fabrication, Structure, Electrical Behavior, and Elastic Modulus BD Bertram, RA Gerhardt, JW Schultz Journal of the American Ceramic Society 94 (12), 4391-4398, 2011 | 12 | 2011 |
| Correction of transmission line induced phase and amplitude errors in reflectivity measurements JW Schultz, R Schultz, J Maloney, K Maloney US Patent 11,215,655, 2022 | 10 | 2022 |
| Methods and apparatus for producing ordered parts from liquid crystal monomers RP Chartoff, JW Schultz, JS Ullett US Patent 6,423,260, 2002 | 10 | 2002 |
| A new dielectric analyzer for rapid measurement of microwave substrates up to 6 GHz JW Schultz 2018 AMTA Proceedings, 1-6, 2018 | 9 | 2018 |
| Advanced high temperature resins for stereolithography JS Ullett, JW Schultz, RP Chartoff Proceedings of 7th International Conference on Rapid Prototyping, San …, 1997 | 9 | 1997 |
| Experience in construction and testing of plastic limited streamer chambers AH Ball, RL Bard, D Bensen, C Cates, JD Colmer, P Floros, DJ Fritz, ... IEEE Transactions on Nuclear Science 37 (2), 225-229, 1990 | 8 | 1990 |
| Near-field probe measurements of microwave scattering from discontinuities in planar surfaces JW Schultz, EJ Hopkins, EJ Kuster IEEE Transactions on Antennas and Propagation 51 (9), 2361-2368, 2003 | 6 | 2003 |
Jim Maloney, Ph.D.Consulting Engineering (jmaloney65@gmail.com)Verified email at gatech.edu
