An analytical drain current model for short-channel triple-material double-gate MOSFETs H Agnihotri, A Ranjan, PK Tiwari, S Jit 2011 IEEE Computer Society Annual Symposium on VLSI, 327-328, 2011 | 5 | 2011 |
Dynamic Template Generation for Physical Design Verification PS Anand Kumaraswamy, Pardeep Saini, Harshit Agnihotri https://priorart.ip.com/IPCOM/00226935, 2013 | | 2013 |
Methodology Checking Flow in 22SOI PS Harshit Agnihotri, Anand Kumaraswamy International Chip Test Best Practices 2013, 0 | | |
Dynamic Template creation using ICV for Physical Design Methodology checking HA Anand Kumaraswamy, Pardeep Saini Synopsys Users Group India 2013 (SNUG), 0 | | |
Harnessing the flexibility of ICV for Methodology checking flow in advanced technology nodes A Kumaraswamy, P Saini, D Varma, H Agnihotri Synopsys Users Group India 2012 (SNUG), 0 | | |