| Spin-polarized transport in magnetically assembled carbon nanotube spin valves R Thamankar, S Niyogi, BY Yoo, YW Rheem, NV Myung, RC Haddon, ... Applied physics letters 89 (3), 2006 | 31 | 2006 |
| Magnetically assembled multiwalled carbon nanotubes on ferromagnetic contacts S Niyogi, C Hangarter, RM Thamankar, YF Chiang, R Kawakami, ... The Journal of Physical Chemistry B 108 (51), 19818-19824, 2004 | 29 | 2004 |
| Spin-reorientation transition in Fe x Ni 1− x alloy films R Thamankar, A Ostroukhova, FO Schumann Physical Review B 66 (13), 134414, 2002 | 27 | 2002 |
| Analysis of quantum conductance, read disturb and switching statistics in HfO2 RRAM using conductive AFM A Ranjan, N Raghavan, J Molina, SJ O'Shea, K Shubhakar, KL Pey Microelectronics Reliability 64, 172-178, 2016 | 25 | 2016 |
| Highly Luminescent Heterostructured Copper‐Doped Zinc Sulfide Nanocrystals for Application in Cancer Cell Labeling H Ang, M Bosman, R Thamankar, MFB Zulkifli, SK Yen, A Hariharan, ... ChemPhysChem 17 (16), 2489-2495, 2016 | 22 | 2016 |
| Low temperature nanoscale electronic transport on the MoS2 surface R Thamankar, TL Yap, KEJ Goh, C Troadec, C Joachim Applied Physics Letters 103 (8), 2013 | 22 | 2013 |
| Structural and magnetic properties of ultrathin fcc Fe x Mn 1− x films on Cu (100) R Thamankar, S Bhagwat, FO Schumann Physical Review B 69 (5), 054411, 2004 | 22 | 2004 |
| Single vacancy defect spectroscopy on HfO2 using random telegraph noise signals from scanning tunneling microscopy R Thamankar, N Raghavan, J Molina, FM Puglisi, SJ O'Shea, ... Journal of Applied Physics 119 (8), 2016 | 21 | 2016 |
| CAFM based spectroscopy of stress-induced defects in HfO2 with experimental evidence of the clustering model and metastable vacancy defect state A Ranjan, N Raghavan, K Shubhakar, R Thamankar, J Molina, SJ O'Shea, ... 2016 IEEE International Reliability Physics Symposium (IRPS), 7A-4-1-7A-4-7, 2016 | 19 | 2016 |
| Effect of controlled humidity on resistive switching of multilayer VO2 devices RT Vithaldas Raja, Keval Hadiyal, Aswini Kumar Nath, Leema Rose Viannie ... Materials Science and Engineering B 264, 114968, 2021 | 12 | 2021 |
| Localized characterization of charge transport and random telegraph noise at the nanoscale in HfO2 films combining scanning tunneling microscopy and multi-scale simulations R. Thamankar et.al Journal of applied Physics 112, 024301, 2017 | 12 | 2017 |
| Effect of submonolayer coverage of Fe and Mn films on the magnetization direction of Ni/Cu (100) R Thamankar, S Bhagwat, FO Schumann Journal of magnetism and magnetic materials 281 (2-3), 206-213, 2004 | 11 | 2004 |
| Structural and magnetic instabilities in ultrathin Fe-rich alloy films on Cu (100) R Thamankar, S Bhagwat, FO Schumann Physical Review B 69 (5), 054419, 2004 | 10 | 2004 |
| Understanding the switching mechanism in RRAM using in-situ TEM KL Pey, R Thamankar, M Sen, M Bosman, N Raghavan, K Shubhakar 2016 IEEE Silicon Nanoelectronics Workshop (SNW), 36-37, 2016 | 9 | 2016 |
| Nanoscale electrical and physical study of polycrystalline high-κ dielectrics and proposed reliability enhancement techniques K Shubhakar, KL Pey, SS Kushvaha, M Bosman, SJ O'Shea, N Raghavan, ... 2011 International Reliability Physics Symposium, GD. 1.1-GD. 1.6, 2011 | 9 | 2011 |
| Perpendicular anisotropy in Ni rich NixMn1− x ultrathin films R Thamankar, S Bhagwat, FO Schumann Journal of Physics: Condensed Matter 16 (34), 6029, 2004 | 8 | 2004 |
| A non-volatile resistive memory effect in 2, 2′, 6, 6′-tetraphenyl-dipyranylidene thin films as observed in field-effect transistors and by conductive atomic force microscopy M Courté, SG Surya, R Thamankar, C Shen, VR Rao, SG Mhailsalkar, ... RSC advances 7 (6), 3336-3342, 2017 | 7 | 2017 |
| Tilting, Bending, and Nonterminal Sites in R Thamankar, HL Meyerheim, A Ernst, S Ostanin, IV Maznichenko, ... Physical Review Letters 106 (10), 106101, 2011 | 7 | 2011 |
| Performance of ultra‐thin HfO2‐based MIM devices after oxygen modulation and post‐metallization annealing in N2 J Molina, R Thamankar, KL Pey physica status solidi (a) 213 (7), 1807-1813, 2016 | 6 | 2016 |
| Nanoscale physical analysis of localized breakdown events in HfO2/SiOX dielectric stacks: A correlation study of STM induced BD with C-AFM and TEM K Shubhakar, KL Pey, M Bosman, R Thamankar, SS Kushvaha, YC Loke, ... 2012 19th IEEE International Symposium on the Physical and Failure Analysis …, 2012 | 6 | 2012 |
