| HfO2 gate dielectric on Ge (1 1 1) with ultrathin nitride interfacial layer formed by rapid thermal NH3 treatment KS Agrawal, VS Patil, AG Khairnar, AM Mahajan Applied Surface Science 364, 747-751, 2016 | 21 | 2016 |
| Structural and electrical properties of ultra-thin high-k ZrO2 film on nitride passivated Ge (100) prepared by PEALD VS Patil, KS Agrawal, AG Khairnar, BJ Thibeault, AM Mahajan Materials Science in Semiconductor Processing 56, 277-281, 2016 | 18 | 2016 |
| XPS study of homemade plasma enhanced atomic layer deposited La2O3/ZrO2 bilayer thin films V Patil, K Agrawal, V Barhate, S Patil, A Mahajan Semiconductor Science and Technology 34 (3), 034004, 2019 | 15 | 2019 |
| High-temperature Josephson diode S Ghosh, V Patil, A Basu, Kuldeep, A Dutta, DA Jangade, R Kulkarni, ... Nature Materials, 1-7, 2024 | 12 | 2024 |
| Preparation of rare earth CeO2 thin films using metal organic decomposition method for metal-oxide–semiconductor capacitors KS Agrawal, VS Patil, AG Khairnar, AM Mahajan Journal of Materials Science: Materials in Electronics 28, 12503-12508, 2017 | 12 | 2017 |
| The effect of post-deposition annealing on the chemical, structural and electrical properties of Al/ZrO2/La2O3/ZrO2/Al high-k nanolaminated MIM capacitors SR Patil, VN Barhate, VS Patil, KS Agrawal, AM Mahajan Journal of Materials Science: Materials in Electronics 33 (14), 11227-11235, 2022 | 9 | 2022 |
| Post-deposition-annealed lanthanum-doped cerium oxide thin films: structural and electrical properties VN Barhate, KS Agrawal, VS Patil, AM Mahajan Rare Metals 40 (7), 1835-1843, 2021 | 9 | 2021 |
| Spectroscopic study of La2O3 thin films deposited by indigenously developed plasma-enhanced atomic layer deposition system V Barhate, K Agrawal, V Patil, S Patil, A Mahajan International Journal of Modern Physics B 32 (19), 1840074, 2018 | 9 | 2018 |
| Atomic layer deposited HfO2 ultra-thin films on different crystallographic orientation Ge for CMOS applications KS Agrawal, VS Patil, AM Mahajan Thin Solid Films 654, 30-37, 2018 | 7 | 2018 |
| Analysis of negative bias illumination stress induced effect on LTPS and a-IGZO TFT KS Agrawal, VS Patil, EC Cho, J Yi ECS Journal of Solid State Science and Technology 9 (10), 106005, 2020 | 6 | 2020 |
| Plasma-enhanced atomic layer-deposited La2O3 ultra-thin films on Si and 6H–SiC: a comparative study KS Agrawal, VN Barhate, VS Patil, LS Patil, AM Mahajan Applied Physics A 126, 1-10, 2020 | 6 | 2020 |
| High mobility field-effect transistors based on MoS2 crystals grown by the flux method V Patil, J Kim, K Agrawal, T Park, J Yi, N Aoki, K Watanabe, T Taniguchi, ... Nanotechnology 32 (32), 325603, 2021 | 5 | 2021 |
| Performance enhancement of Al/La2O3/ZrO2/4H–SiC MOS device with LaON as interfacial passivation layer VN Barhate, KS Agrawal, VS Patil, SR Patil, AM Mahajan Materials Science in Semiconductor Processing 117, 105161, 2020 | 4 | 2020 |
| Interfacial and electrical properties of Al2O3/HfO2 bilayer deposited by atomic layer deposition on GeON passivated germanium surface VS Patil, KS Agrawal, AG Khairnar, BJ Thibeault, AM Mahajan Materials Research Bulletin 87, 208-213, 2017 | 4 | 2017 |
| Investigation of asymmetric degradation in electrical properties of a-InGaZnO thin-film transistor arrays as a function of channel width-to-length aspect ratio K Agrawal, V Patil, GT Chavan, G Yoon, J Kim, J Park, S Pae, JS Kim, ... Journal of Materials Science: Materials in Electronics 31, 9826-9834, 2020 | 3 | 2020 |
| Temperature-dependent study of slow traps generation mechanism in HfO2/GeON/Ge (1 1 0) metal oxide semiconductor devices K Agrawal, V Patil, V Barhate, G Yoon, YJ Lee, A Mahajan, J Yi Solid-State Electronics 167, 107797, 2020 | 2 | 2020 |
| Improvement in Electrical Properties of A1/La2O3/ZrO2/ Gate Stack Deposited on LaON Passivated GaAs Substrate AMM VN Barhate, KS Agrawal, VS Patil 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),, 1-4, 2020 | 1 | 2020 |
| PEALD grown high-k ZrO2 thin films on SiC group IV compound semiconductor AG Khairnar, VS Patil, KS Agrawal, RS Salunke, AM Mahajan Semiconductors 51, 131-133, 2017 | 1 | 2017 |
| Similarity Measurement using Shape Feature for Image Retrieval SR Patil, VS Patil International Conference on Global Trends in Engineering, Technology and …, 2016 | 1 | 2016 |
| Investigation of Current Conduction Mechanism in HfO2 Thin Film on Silicon Substrate AG Khairnar, KS Agrawal, VS Patil, AM Mahajan Physics of Semiconductor Devices: 17th International Workshop on the Physics …, 2014 | 1 | 2014 |
Khushabu AgrawalTyndall National Institute Cork, IrelandVerified email at skku.edu
