Jamil Akhtar
Jamil Akhtar
Director, SEEC, Manipal University Jaipur, INDIA
Verified email at jaipur.manipal.edu - Homepage
Cited by
Cited by
Physics and technology of silicon carbide devices
Y Hijikata
BoD–Books on Demand, 2012
Fabrication of electron beam physical vapor deposited polysilicon piezoresistive MEMS pressure sensor
K Singh, R Joyce, S Varghese, J Akhtar
Sensors and Actuators A: Physical 223, 151-158, 2015
A digital hygrometer for trace moisture measurement
T Islam, AU Khan, J Akhtar, MZU Rahman
IEEE Transactions on Industrial Electronics 61 (10), 5599-5605, 2014
Synthesis, phase to phase deposition and characterization of rutile nanocrystalline titanium dioxide (TiO2) thin films
SK Gupta, J Singh, K Anbalagan, P Kothari, RR Bhatia, PK Mishra, ...
Applied surface science 264, 737-742, 2013
Growth of residual stress-free ZnO films on SiO2/Si substrate at room temperature for MEMS devices
J Singh, S Ranwa, J Akhtar, M Kumar
AIP Advances 5 (6), 067140, 2015
MeV ion-induced movement of lattice disorder in single crystalline silicon
P Sen, J Akhtar, FM Russell
EPL (Europhysics Letters) 51 (4), 401, 2000
Barrier height inhomogeneities induced anomaly in thermal sensitivity of Ni/4H-SiC Schottky diode temperature sensor
V Kumar, AS Maan, J Akhtar
Journal of Vacuum Science & Technology B, Nanotechnology and …, 2014
Improved electrical parameters of vacuum annealed Ni/4H-SiC (0 0 0 1) Schottky barrier diode
SK Gupta, A Azam, J Akhtar
Physica B: Condensed Matter 406 (15-16), 3030-3035, 2011
Capacitance–conductance spectroscopic investigation of interfacial oxide layer in Ni/4H–SiC (0 0 0 1) Schottky diode
SK Gupta, B Shankar, WR Taube, J Singh, J Akhtar
Physica B: Condensed Matter 434, 44-50, 2014
A study on anisotropic etching of (100) silicon in aqueous KOH solution
PA Alvi, VS Meel, K Sarita, J Akhtar, KM Lal, A Azam, SAH Naqvi
International Journal of Chemical Sciences 6 (3), 1168-1176, 2008
Design, fabrication, and characterization of Ni/4H-SiC (0001) Schottky diodes array equipped with field plate and floating guard ring edge termination structures
SK Gupta, N Pradhan, C Shekhar, J Akhtar
IEEE transactions on semiconductor manufacturing 25 (4), 664-672, 2012
Investigation of structural and magnetic properties of Ni, NiFe and NiFe2O4 thin films
J Singh, SK Gupta, AK Singh, P Kothari, RK Kotnala, J Akhtar
Journal of magnetism and magnetic materials 324 (6), 999-1005, 2012
Ultrathin films of single-walled carbon nanotubes: A potential methane gas sensor
M Poonia, V Manjuladevi, RK Gupta, SK Gupta, J Singh, PB Agarwal, ...
Science of Advanced Materials 7 (3), 455-462, 2015
Variation of interface trap level charge density within the bandgap of 4H-SiC with varying oxide thickness
SK Gupta, A Azam, J Akhtar
Pramana 76 (1), 165-172, 2011
Polysilicon piezoresistive pressure sensors based on MEMS technology
J Akhtar, BB Dixit, BD Pant, VP Deshwal
IETE journal of research 49 (6), 365-377, 2003
Room temperature single walled carbon nanotubes (SWCNT) chemiresistive ammonia gas sensor
BS Dasari, WR Taube, PB Agarwal, M Rajput, A Kumar, J Akhtar
Sensors & Transducers 190 (7), 24, 2015
Effective cleaning process and its influence on surface roughness in anodic bonding for semiconductor device packaging
R Joyce, K Singh, S Varghese, J Akhtar
Materials Science in Semiconductor Processing 31, 84-93, 2015
An oscillator-based active bridge circuit for interfacing capacitive sensors with microcontroller compatibility
AU Khan, T Islam, J Akhtar
IEEE Transactions on Instrumentation and Measurement 65 (11), 2560-2568, 2016
Capacitance roll‐off and frequency‐dispersion capacitance–conductance phenomena in field plate and guard ring edge‐terminated Ni/SiO2/4H‐nSiC Schottky …
V Kumar, N Kaminski, AS Maan, J Akhtar
physica status solidi (a) 213 (1), 193-202, 2016
Materials and processing for gate dielectrics on silicon carbide (SiC) surface
SK Gupta, J Singh, J Akhtar
Physics and Technology of Silicon Carbide Devices, 207-234, 2012
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