| A methodology for trace signal selection to improve error detection in post-silicon validation B Kumar, A Jindal, V Singh, M Fujita 2017 30th International Conference on VLSI Design and 2017 16th …, 2017 | 19 | 2017 |
| Power–Delay-Error-Efficient Approximate Adder for Error-Resilient Applications V Kumar, A Singh, S Upadhyay, B Kumar Journal of Circuits, Systems and Computers 28 (10), 1950171, 2019 | 16 | 2019 |
| Analyzing hardware security properties of processors through model checking B Kumar, AK Jaiswal, VS Vineesh, R Shinde 2020 33rd International Conference on VLSI Design and 2020 19th …, 2020 | 14 | 2020 |
| Deeppeep: Exploiting design ramifications to decipher the architecture of compact dnns NK Jha, S Mittal, B Kumar, G Mattela ACM Journal on Emerging Technologies in Computing Systems (JETC) 17 (1), 1-25, 2020 | 12 | 2020 |
| Post-silicon gate-level error localization with effective and combined trace signal selection B Kumar, K Basu, M Fujita, V Singh IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2018 | 12 | 2018 |
| Post-silicon observability enhancement with topology based trace signal selection B Kumar, A Jindal, M Fujita, V Singh 2017 18th IEEE Latin American Test Symposium (LATS), 1-6, 2017 | 12 | 2017 |
| RTL level trace signal selection and coverage estimation during post-silicon validation B Kumar, K Basu, M Fujita, V Singh 2017 IEEE International High Level Design Validation and Test Workshop …, 2017 | 11 | 2017 |
| Combining restorability and error detection ability for effective trace signal selection B Kumar, A Jindal, M Fujita, V Singh Proceedings of the Great Lakes Symposium on VLSI 2017, 191-196, 2017 | 11 | 2017 |
| Testing multiple stuck-at faults of robdd based combinational circuit design T Shah, A Matrosova, B Kumar, M Fujita, V Singh 2017 18th IEEE Latin American Test Symposium (LATS), 1-6, 2017 | 8 | 2017 |
| A methodology to capture fine-grained internal visibility during multisession silicon debug B Kumar, J Adhaduk, K Basu, M Fujita, V Singh IEEE Transactions on Very Large Scale Integration (VLSI) Systems 28 (4 …, 2020 | 7 | 2020 |
| Silicon debug with maximally expanded internal observability using nearest neighbor algorithm A Jindal, B Kumar, N Jindal, M Fujita, V Singh 2018 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 46-51, 2018 | 6 | 2018 |
| A technique for low power, stuck-at fault diagnosable and reconfigurable scan architecture B Kumar, B Nehru, B Pandey, V Singh, J Tudu 2016 IEEE East-West Design & Test Symposium (EWDTS), 1-4, 2016 | 6 | 2016 |
| Identification of effective guidance hints for better design debugging by formal methods VS Vineesh, B Kumar, J Adhaduk VLSI Design and Test: 23rd International Symposium, VDAT 2019, Indore, India …, 2019 | 5 | 2019 |
| Improving post-silicon error detection with topological selection of trace signals B Kumar, K Basu, A Jindal, M Fujita, V Singh 2017 IFIP/IEEE International Conference on Very Large Scale Integration …, 2017 | 5 | 2017 |
| Performance modelling of heterogeneous isa multicore architectures NK Boran, RP Meghwal, K Sharma, B Kumar, V Singh 2016 IEEE East-West Design & Test Symposium (EWDTS), 1-4, 2016 | 5 | 2016 |
| Blood pressure estimation from ECG data using XGBoost and ANN for wearable devices S Banerjee, B Kumar, AP James, JN Tripathi 2022 29th IEEE International Conference on Electronics, Circuits and Systems …, 2022 | 4 | 2022 |
| Aries: A Semiformal Technique for Fine-Grained Bug Localization in Hardware Designs B Kumar, VS Vineesh, P Nemade, M Fujita IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2022 | 4 | 2022 |
| Enhanced design debugging with assistance from guidance-based model checking VS Vineesh, B Kumar, R Shinde, N Sharma, M Fujita, V Singh IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2020 | 4 | 2020 |
| Validating multi-processor cache coherence mechanisms under diminished observability B Kumar, AK Bhosale, M Fujita, V Singh 2019 IEEE 28th Asian Test Symposium (ATS), 99-995, 2019 | 4 | 2019 |
| A trace signal selection algorithm for improved post-silicon debug B Kumar, A Jindal, V Singh 2016 IEEE East-West Design & Test Symposium (EWDTS), 1-4, 2016 | 4 | 2016 |
Masahiro FujitaUniversity of TokyoVerified email at ee.t.u-tokyo.ac.jp
