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### Co-authors

- Geok Ing NgNanyang Technological UniversityVerified email at ntu.edu.sg
- Subramaniam ArulkumaranTemasek Laboratories@NTU, Nanyang Technological UniversityVerified email at ntu.edu.sg
- Vicknesh SahmuganathanApplied Materials South East Asia Pte LtdVerified email at amat.com
- Zhihong LiuXidian University, ChinaVerified email at xidian.edu.cn
- Abhinay SandupatlaIMECVerified email at e.ntu.edu.sg
- Sudhiranjan TripathyAgency for Science, Technology, and Research (A*STAR-IMRE, Singapore)Verified email at imre.a-star.edu.sg
- Dr. John V KennedyPrincipal Scientist, GNS Science,Verified email at gns.cri.nz
- MANOJ KUMAR CHANDRA MOHANChonnam National University, South KoreaVerified email at ntu.edu.sg
- Hiroshi AMANO (天野 浩)Nagoya University (名古屋大学)Verified email at nuee.nagoya-u.ac.jp
- Yoshio HondaNagoyaVerified email at nuee.nagoya-u.ac.jp
- Servin RathiResearch FellowVerified email at ucl.ac.uk
- Tomás PalaciosMITVerified email at mit.edu
- Siddharth RajanElectrical and Computer Engineering, Ohio State UniversityVerified email at ece.osu.edu
- Kuldeep TakharMicron Technology Singapore, IIT BombayVerified email at iitb.ac.in
- BINIT SYAMALNTU SINGAPOREVerified email at ntu.edu.sg