| Software configurable optical test system: a computerized reverse Hartmann test P Su, RE Parks, L Wang, RP Angel, JH Burge Applied optics 49 (23), 4404-4412, 2010 | 314 | 2010 |
| Nonlinear optical reflection from a metallic boundary F Brown, RE Parks, AM Sleeper Physical Review Letters 14 (25), 1029, 1965 | 264 | 1965 |
| Magnetic-dipole contribution to optical harmonics in silver F Brown, RE Parks Physical Review Letters 16 (12), 507, 1966 | 105 | 1966 |
| Optical profilometer combined with stylus probe measurement device A Samsavar, M Weber, T McWaid, WP Kuhn, RE Parks US Patent 5,955,661, 1999 | 94 | 1999 |
| Removal of test optics errors RE Parks Advances in Optical Metrology I 153, 56-63, 1978 | 94 | 1978 |
| Aspheric and freeform surfaces metrology with software configurable optical test system: a computerized reverse Hartmann test P Su, MAH Khreishi, T Su, R Huang, MZ Dominguez, A Maldonado, ... Optical Engineering 53 (3), 031305-031305, 2014 | 81 | 2014 |
| SCOTS: a reverse Hartmann test with high dynamic range for Giant Magellan Telescope primary mirror segments P Su, S Wang, M Khreishi, Y Wang, T Su, P Zhou, RE Parks, K Law, ... Modern Technologies in Space-and Ground-based Telescopes and Instrumentation …, 2012 | 71 | 2012 |
| Pixel-based absolute topography test for three flats RE Parks, L Shao, CJ Evans Applied optics 37 (25), 5951-5956, 1998 | 64 | 1998 |
| Swing-arm optical CMM for aspherics P Su, CJ Oh, RE Parks, JH Burge Optical Manufacturing and Testing VIII 7426, 150-157, 2009 | 60 | 2009 |
| Optical alignment using the point source microscope RE Parks, WP Kuhn Optomechanics 2005 5877, 102-116, 2005 | 59 | 2005 |
| Application of maximum likelihood reconstruction of subaperture data for measurement of large flat mirrors P Su, JH Burge, RE Parks Applied optics 49 (1), 21-31, 2010 | 55 | 2010 |
| Calibration of interferometer transmission spheres RE Parks, C Evans, L Shao Optical Fabrication and Testing, OTuC. 1, 1998 | 55 | 1998 |
| Fabrication and testing of 1.4-m convex off-axis aspheric optical surfaces JH Burge, S Benjamin, D Caywood, C Noble, M Novak, C Oh, R Parks, ... Optical manufacturing and testing VIII 7426, 167-178, 2009 | 51 | 2009 |
| Measuring rough optical surfaces using scanning long-wave optical test system. 1. Principle and implementation T Su, S Wang, RE Parks, P Su, JH Burge Applied optics 52 (29), 7117-7126, 2013 | 48 | 2013 |
| Silicon wafer thickness variation measurements using the National Institute of Standards and Technology infrared interferometer TL Schmitz, A Davies, CJ Evans, RE Parks Optical Engineering 42 (8), 2281-2290, 2003 | 43 | 2003 |
| Visualization of surface figure by the use of Zernike polynomials CJ Evans, RE Parks, PJ Sullivan, JS Taylor Applied optics 34 (34), 7815-7819, 1995 | 42 | 1995 |
| Specifications: figure and finish are not enough RE Parks An optical Believe It or Not: Key Lessons Learned 7071, 46-54, 2008 | 41 | 2008 |
| Strength of glass from Hertzian line contact W Cai, B Cuerden, RE Parks, JH Burge Optomechanics 2011: Innovations and Solutions 8125, 113-121, 2011 | 40 | 2011 |
| Renewable polishing lap CJ Evans, RE Parks US Patent 5,897,424, 1999 | 39 | 1999 |
| Scanning long-wave optical test system: a new ground optical surface slope test system T Su, WH Park, RE Parks, P Su, JH Burge Optical Manufacturing and Testing IX 8126, 100-109, 2011 | 38 | 2011 |
