| Surface Roughness Characterization of Annealed Polycrystalline Silicon Solar Wafers Using a Laser Speckle Imaging (LSI) Technique. R Balamurugan, R Prakasam Lasers in Engineering (Old City Publishing) 47, 2020 | 2 | 2020 |
| Laser speckle computation for the evaluation of surface roughness R Balamurugan, R Prakasam, C Manimaran AIP Conference Proceedings 2352 (1), 2021 | 1 | 2021 |
| Laser Speckle Decorrelation Technique for In-plane Deformation Measurement. R Balamurugan, R Prakasam, R Kannan, R Sengodan Lasers in Engineering (Old City Publishing) 39, 2018 | 1 | 2018 |
| Improvised surface property of Al-7075 alloy by laser shock peening technique R Thiruneelakandan, R Balamurugan, R Prakasam Materials Today: Proceedings 92, 1597-1601, 2023 | | 2023 |
| A computational approach for the determination of thermal conductivity of cardboard using Lee’s disc method K Maheswari, J Dhivya, R Prakasam, J Rajasingh AIP Conference Proceedings 2446 (1), 2022 | | 2022 |
| A comparative surface roughness study of silicon wafer by laser speckle technique, atomic force microscopy and stylus profilometry R Prakasam, R Balamurugan, S Balasubramanian AIP Conference Proceedings 2446 (1), 2022 | | 2022 |
| List of Committee Members Chief Patron R Prakasam, V Bindhu, JIZ Chen, S Shakya, P Campus Journal of Physics: Conference Series 2325, 011001, 2022 | | 2022 |
| Surface roughness characterization of plasma textured polycrystalline silicon solar wafer with the laser speckle technique R Balamurugan, R Prakasam, B Jeeva, T Anupriyanka, ... AIP Conference Proceedings 2270 (1), 090001, 2020 | | 2020 |
| Nano/microlevel Surface Roughness Measurement of Polycrystalline Silicon Solar Wafer with the Laser Speckle Technique. R Prakasam, R Balamurugan Lasers in Engineering (Old City Publishing) 45, 2020 | | 2020 |
| NON DESTRUCTIVE FLAW DETECTION BY LASER SPECKLE PHOTOGRAPHY R Prakasam, R Balamurugan International Journal of Pure and Applied Mathematics 117 (8), 117-120, 2017 | | 2017 |
| SURFACE ROUGHNESS MEASUREMENT BY LASER SPECKLE TECHNIQUE R BALAMURUGAN, R PRAKASAM, B JEEVA | | |
| Laser speckle studies of silicon Wafer for solar cell devices R Prakasam Chennai, 0 | | |
| CHIEF PATRON R Prakasam, V Bindhu, NM Kumar, D Nirmal, K Deng, AT Azar, ... | | |
