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Harshit Agarwal
Harshit Agarwal
Unknown affiliation
Verified email at andrew.cmu.edu
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Cited by
Cited by
Year
Effects of alirocumab on cardiovascular and metabolic outcomes after acute coronary syndrome in patients with or without diabetes: a prespecified analysis of the ODYSSEY …
KK Ray, HM Colhoun, M Szarek, M Baccara-Dinet, DL Bhatt, VA Bittner, ...
The lancet Diabetes & endocrinology 7 (8), 618-628, 2019
2422019
A learning automata based solution for preventing distributed denial of service in internet of things
S Misra, PV Krishna, H Agarwal, A Saxena, MS Obaidat
2011 international conference on internet of things and 4th international …, 2011
1362011
BSIM6: Analog and RF compact model for bulk MOSFET
YS Chauhan, S Venugopalan, MA Chalkiadaki, MAU Karim, H Agarwal, ...
IEEE Transactions on Electron Devices 61 (2), 234-244, 2013
1322013
Engineering negative differential resistance in NCFETs for analog applications
H Agarwal, P Kushwaha, JP Duarte, YK Lin, AB Sachid, MY Kao, ...
IEEE Transactions on Electron Devices 65 (5), 2033-2039, 2018
952018
BSIM-CMG: Standard FinFET compact model for advanced circuit design
JP Duarte, S Khandelwal, A Medury, C Hu, P Kushwaha, H Agarwal, ...
ESSCIRC Conference 2015-41st European Solid-State Circuits Conference …, 2015
902015
First Industrial Revolution and Second Industrial Revolution: Technological differences and the differences in banking and financing of the firms
H Agarwal, R Agarwal
Saudi Journal of Humanities and Social Sciences 2 (11), 1062-1066, 2017
812017
Proposal for capacitance matching in negative capacitance field-effect transistors
H Agarwal, P Kushwaha, YK Lin, MY Kao, YH Liao, A Dasgupta, ...
IEEE Electron Device Letters 40 (3), 463-466, 2019
782019
An adaptive learning approach for fault-tolerant routing in Internet of Things
S Misra, A Gupta, PV Krishna, H Agarwal, MS Obaidat
2012 IEEE Wireless Communications and Networking Conference (WCNC), 815-819, 2012
552012
BSIM compact model of quantum confinement in advanced nanosheet FETs
A Dasgupta, SS Parihar, P Kushwaha, H Agarwal, MY Kao, S Salahuddin, ...
IEEE Transactions on Electron Devices 67 (2), 730-737, 2020
462020
Analysis and modeling of inner fringing field effect on negative capacitance FinFETs
YK Lin, H Agarwal, P Kushwaha, MY Kao, YH Liao, K Chatterjee, ...
IEEE Transactions on Electron Devices 66 (4), 2023-2027, 2019
442019
NCFET design considering maximum interface electric field
H Agarwal, P Kushwaha, YK Lin, MY Kao, YH Liao, JP Duarte, ...
IEEE Electron Device Letters 39 (8), 1254-1257, 2018
412018
Efficient medium access control for cyber–physical systems with heterogeneous networks
S Misra, PV Krishna, V Saritha, H Agarwal, L Shu, MS Obaidat
IEEE systems journal 9 (1), 22-30, 2013
402013
Spacer engineering in negative capacitance FinFETs
YK Lin, H Agarwal, MY Kao, J Zhou, YH Liao, A Dasgupta, P Kushwaha, ...
IEEE Electron Device Letters 40 (6), 1009-1012, 2019
392019
Variation caused by spatial distribution of dielectric and ferroelectric grains in a negative capacitance field-effect transistor
MY Kao, AB Sachid, YK Lin, YH Liao, H Agarwal, P Kushwaha, JP Duarte, ...
IEEE Transactions on Electron Devices 65 (10), 4652-4658, 2018
372018
BSIM compact MOSFET models for SPICE simulation
YS Chauhan, S Venugopalan, N Paydavosi, P Kushwaha, S Jandhyala, ...
Proceedings of the 20th International Conference Mixed Design of Integrated …, 2013
362013
Design optimization techniques in nanosheet transistor for RF applications
P Kushwaha, A Dasgupta, MY Kao, H Agarwal, S Salahuddin, C Hu
IEEE Transactions on Electron Devices 67 (10), 4515-4520, 2020
342020
Designing 0.5 V 5-nm HP and 0.23 V 5-nm LP NC-FinFETs With Improved Sensitivity in Presence of Parasitic Capacitance
H Agarwal, P Kushwaha, JP Duarte, YK Lin, AB Sachid, HL Chang, ...
IEEE Transactions on Electron Devices 65 (3), 1211-1216, 2018
332018
Modeling the impact of substrate depletion in FDSOI MOSFETs
P Kushwaha, N Paydavosi, S Khandelwal, C Yadav, H Agarwal, ...
Solid-State Electronics 104, 6-11, 2015
322015
Characterization and modeling of flicker noise in FinFETs at advanced technology node
P Kushwaha, H Agarwal, YK Lin, A Dasgupta, MY Kao, Y Lu, Y Yue, ...
IEEE Electron Device Letters 40 (6), 985-988, 2019
312019
Learning automata-based multi-constrained fault-tolerance approach for effective energy management in smart grid communication network
S Misra, PV Krishna, V Saritha, H Agarwal, A Ahuja
Journal of Network and Computer Applications 44, 212-219, 2014
302014
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