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Ankur Vishnoi
Ankur Vishnoi
Research Scholar, IIT Kanpur
Verified email at iitk.ac.in
Title
Cited by
Cited by
Year
Rapid deformation analysis in digital holographic interferometry using graphics processing unit accelerated Wigner–Ville distribution
A Vishnoi, G Rajshekhar
Applied optics 58 (16), 4420-4424, 2019
272019
Phase derivative estimation in digital holographic interferometry using a deep learning approach
AVS Vithin, A Vishnoi, R Gannavarpu
Applied Optics 61 (11), 3061-3069, 2022
162022
Automated defect identification from carrier fringe patterns using Wigner–Ville distribution and a machine learning-based method
A Vishnoi, A Madipadaga, S Ajithaprasad, R Gannavarpu
Applied Optics 60 (15), 4391-4397, 2021
142021
Wigner–Ville distribution based diffraction phase microscopy for non-destructive testing
A Vishnoi, A Sreeprasad, G Rajshekhar
Journal of Modern Optics 66 (16), 1644-1651, 2019
102019
Phase recovery method in digital holographic interferometry using high-resolution signal parameter estimation
A Vishnoi, J Ramaiah, G Rajshekhar
Applied optics 58 (6), 1485-1490, 2019
102019
Demodulation of noisy interferograms with rapid phase variations and amplitude fluctuations using a surrogate principle-based optimization method
AVS Vithin, A Vishnoi, R Gannavarpu
Applied Optics 60 (7), 1937-1942, 2021
32021
Single shot quantitative phase gradient estimation using Wigner-Ville distribution in digital holographic microscopy
A Vishnoi, R Gannavarpu
OSA Continuum 4 (9), 2452-2459, 2021
22021
Wrapped phase denoising using adaptive Kalman smoother algorithm
S Sharma, R Kulkarni, A Vishnoi, R Gannavarpu
Journal of Modern Optics 69 (15), 838-849, 2022
12022
Non-invasive surface profile measurement using a unitary transformation subspace approach in digital holography
J Ramaiah, A Vishnoi, R Gannavarpu
Optics Continuum 1 (4), 684-696, 2022
12022
High Speed Non-destructive Testing Method Using Digital Holographic Interferometry
A Vishnoi, G Rajshekhar
ICOL-2019: Proceedings of the International Conference on Optics and Electro …, 2021
12021
Fast fringe analysis method using graphics processing unit acceleration for dynamic fault identification
A Vishnoi, R Gannavarpu
Optics and Photonics for Advanced Dimensional Metrology 11352, 118-124, 2020
12020
Graphics processing unit assisted space-frequency method for high-speed defect propagation analysis from fringe patterns
A Vishnoi, G Rajshekhar
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