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Julio Brandelero
Julio Brandelero
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Cited by
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Year
A high voltage high frequency resonant inverter for supplying DBD devices with short discharge current pulses
X Bonnin, J Brandelero, N Videau, H Piquet, T Meynard
IEEE Transactions on Power Electronics 29 (8), 4261-4269, 2013
562013
A non-intrusive method for measuring switching losses of GaN power transistors
J Brandelero, B Cougo, T Meynard, N Videau
IECON 2013-39th Annual Conference of the IEEE Industrial Electronics Society …, 2013
532013
An isolated multicell intercell transformer converter for applications with a high step-up ratio
F Forest, TA Meynard, E Labouré, B Gelis, JJ Huselstein, JC Brandelero
IEEE transactions on power electronics 28 (3), 1107-1119, 2012
442012
Selective gate driving in intelligent power modules
J Brandelero, J Ewanchuk, S Mollov
IEEE Transactions on Power Electronics 36 (1), 898-910, 2020
302020
Online junction temperature measurements for power cycling power modules with high switching frequencies
J Brandelero, J Ewanchuk, S Mollov
Power Semiconductor Devices and ICs (ISPSD), 2016 28th International …, 2016
292016
On-line virtual junction temperature measurement via DC gate current injection
J Brandelero, J Ewanchuk, S Mollov
CIPS 2018; 10th International Conference on Integrated Power Electronics …, 2018
242018
Lifetime extension of a multi-die SiC power module using selective gate driving with temperature feedforward compensation
J Ewanchuk, J Brandelero, S Mollov
2017 IEEE Energy Conversion Congress and Exposition (ECCE), 2520-2526, 2017
232017
Conception et réalisation d'un convertisseur multicellulaire DC/DC isolé pour application aéronautique
JC Brandelero
232015
5-phase interleaved buck converter with gallium nitride transistors
N Videau, T Meynard, V Bley, D Flumian, E Sarraute, G Fontes, ...
The 1st IEEE Workshop on Wide Bandgap Power Devices and Applications, 190-193, 2013
222013
Accurate switching energy estimation of parallel eGaN FETs for modern aircraft applications
B Cougo, H Schneider, J Brandelero, T Meynard
The 1st IEEE Workshop on Wide Bandgap Power Devices and Applications, 108-111, 2013
212013
Optimization of forced-air cooling system for accurate design of power converters
A Castelan, B Cougo, J Brandelero, D Flumian, T Meynard
2015 IEEE 24th International Symposium on Industrial Electronics (ISIE), 367-372, 2015
202015
Design of differential mode filters for two-level and multicell converters
T Meynard, B Cougo, J Brandelero
2013 IEEE 11th International Workshop of Electronics, Control, Measurement …, 2013
142013
Evaluation des pertes par commutation pour la conception des convertisseurs et applications des composants grand gap
J Brandelero, B Cougo, T Meynard, N Videau, O Goualard, X Bonnin, ...
Symposium de Génie Électrique 2014, 2014
122014
A gate driver based approach to improving the current density in a power module by equalizing the individual die temperatures
J Ewanchuk, J Brandelero, S Mollov
2018 IEEE Energy Conversion Congress and Exposition (ECCE), 4652-4658, 2018
92018
Lifetime extension through Tj equalisation by use of intelligent gate driver with multi-chip power module
J Brandelero, J Ewanchuk, N Degrenne, S Mollov
Microelectronics Reliability 88, 428-432, 2018
82018
Method and device for determining junction temperature of die of semiconductor power module
J Ewanchuk, S Mollov, J Robinson, J Brandelero
US Patent 11,448,557, 2022
72022
Diagnostic device and method to establish degradation state of electrical connection in power semiconductor device
N Degrenne, JC Brandelero
US Patent 11,169,201, 2021
62021
Improving the die utilization and lifetime in a multi-die SiC power module by means of integrated per-die gate buffers
J Ewanchuk, J Brandelero, S Mollov
2017 29th International Symposium on Power Semiconductor Devices and IC's …, 2017
62017
Conception et réalisation d’un convertisseur multicellulaire DC
JC Brandelero
DC isolé pour application aéronautique (Doctoral dissertation, École …, 2015
62015
Impact of heat treatment on the lifetime of wire-bonded power modules
J Brandelero, P Pichon, M Legros
Microelectronics Reliability 126, 114251, 2021
42021
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