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Paolo Cova
Paolo Cova
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Cited by
Year
Lifetime prediction and design of reliability tests for high-power devices in automotive applications
M Ciappa, F Carbognani, W Fichtner
IEEE Transactions on device and materials reliability 3 (4), 191-196, 2003
1932003
Breakdown walkout in pseudomorphic HEMT's
R Menozzi, P Cova, C Canali, F Fantini
IEEE Transactions on Electron Devices 43 (4), 543-546, 1996
1131996
On the effect of power cycling stress on IGBT modules
P Cova, F Fantini
Microelectronics Reliability 38 (6-8), 1347-1352, 1998
1021998
Review of oscillating water column converters
N Delmonte, D Barater, F Giuliani, P Cova, G Buticchi
IEEE Transactions on Industry Applications 52 (2), 1698-1710, 2015
932015
A method for the analysis of multiphase bonding structures in amorphous SiOxNy films
P Cova, S Poulin, O Grenier, RA Masut
Journal of applied physics 97 (7), 2005
822005
Hot electron degradation of the DC and RF characteristics of AlGaAs/InGaAs/GaAs PHEMT's
M Borgarino, R Menozzi, Y Baeyens, P Cova, F Fantini
IEEE Transactions on Electron Devices 45 (2), 366-372, 1998
731998
Trapped charge modulation: a new cause of instability in AlGaAs/InGaAs pseudomorphic HEMT's
G Meneghesso, C Canali, P Cova, E De Bortoli, E Zanoni
IEEE Electron Device Letters 17 (5), 232-234, 1996
691996
A novel thermomechanics-based lifetime prediction model for cycle fatigue failure mechanisms in power semiconductors
M Ciappa, F Carbognani, P Cova, W Fichtner
Microelectronics reliability 42, 1653-1658, 2002
672002
Comparison of the heat transfer capabilities of conventional single-and two-phase cooling systems for an electric vehicle IGBT power module
I Aranzabal, IM de Alegría, N Delmonte, P Cova, I Kortabarria
IEEE Transactions on Power Electronics 34 (5), 4185-4194, 2018
642018
Analysis of heavy ion irradiation induced thermal damage in SiC Schottky diodes
C Abbate, G Busatto, P Cova, N Delmonte, F Giuliani, F Iannuzzo, ...
IEEE Transactions on Nuclear Science 62 (1), 202-209, 2015
542015
Enhancement and degradation of drain current in pseudomorphic AlGaAs/InGaAs HEMTs induced by hot-electrons
C Canali, P Cova, E De Bortoli, F Fantini, G Meneghesso, R Menozzi, ...
Proceedings of 1995 IEEE International Reliability Physics Symposium, 205-211, 1995
501995
Thermo-mechanical finite element analysis in press-packed IGBT design
A Pirondi, G Nicoletto, P Cova, M Pasqualetti, M Portesine
Microelectronics Reliability 40 (7), 1163-1172, 2000
482000
АЛЬТМЕТРИКИ
SC WU
JOURNAL OF HIGH ENERGY PHYSICS 4 (9-1), 2000
47*2000
Effet des paramètres de croissance sur les couches épitaxiales d'InP obtenues par MOCVD (metal-organic chemical vapor deposition) à basse pression
P Cova, RA Masut, JF Currie, A Bensaada, R Leonelli, CA Tran
Canadian Journal of Physics 69 (3-4), 412-421, 1991
381991
Thermal optimization of water heat sink for power converters with tight thermal constraints
P Cova, N Delmonte, F Giuliani, M Citterio, S Latorre, M Lazzaroni, ...
Microelectronics Reliability 53 (9-11), 1760-1765, 2013
362013
Oscillating water column power conversion: A technology review
N Delmonte, D Barater, F Giuliani, P Cova, G Buticchi
2014 IEEE Energy Conversion Congress and Exposition (ECCE), 1852-1859, 2014
352014
Thermal modeling of planar transformer for switching power converters
M Bernardoni, N Delmonte, P Cova, R Menozzi
Microelectronics Reliability 50 (9-11), 1778-1782, 2010
352010
Power cycling on press-pack IGBTs: measurements and thermomechanical simulation
P Cova, G Nicoletto, A Pirondi, M Portesine, M Pasqualetti
Microelectronics Reliability 39 (6-7), 1165-1170, 1999
341999
Thermal characterization of IGBT power modules
P Cova, M Ciappa, G Franceschini, P Malberti, F Fantini
Microelectronics Reliability 37 (10-11), 1731-1734, 1997
321997
Thermal damage in SiC Schottky diodes induced by SE heavy ions
C Abbate, G Busatto, P Cova, N Delmonte, F Giuliani, F Iannuzzo, ...
Microelectronics Reliability 54 (9-10), 2200-2206, 2014
312014
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