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Co-authors
- Ming C. WuProfessor of Electrical Engineering and Computer Sciences, University of California, BerkeleyVerified email at eecs.berkeley.edu
- Guangya ZhouNational University of SingaporeVerified email at nus.edu.sg
- John X.J. Zhang (张晓晶)Professor, Thayer School of Engineering, Dartmouth CollegeVerified email at stanfordalumni.org
- Kyoungsik YuKAIST, Electrical EngineeringVerified email at kaist.edu
- James TunnellUniversity of TexasVerified email at mail.utexas.edu
- Yue LuUC BerkeleyVerified email at berkeley.edu
- Pierre-Alexandre BlancheCollege of Optical SciencesVerified email at optics.arizona.edu
- Xiaosheng ZhangFounding Engineer, nEYE SystemsVerified email at neyesys.com
- Kyungmok KwonUC BerkeleyVerified email at kaist.ac.kr
- Milan RajB.S. Biomedical Engineering, The University of Texas at AustinVerified email at utexas.edu
- Bin YangAssistant Professor of Biomedical Engineering, Duquesne UniversityVerified email at duq.edu
- Yiğit Dağhan GökdelAssociate Professor, Istanbul Bilgi UniversityVerified email at bilgi.edu.tr
- Chengkuo LeeGlobalFoundries Chair Professor in Eng., ECE Department, National University of SingaporeVerified email at nus.edu.sg
- Shanbao TongProfessor of Biomedical Engineering, Shanghai Jiao Tong UniversityVerified email at sjtu.edu.cn
- Jinyang LiangAssociate Professor at Institut National de la Recherche Scientifique - Université du QuébecVerified email at emt.inrs.ca
- Kunal BhutaniJ. Craig Venter Institute, UCSDVerified email at ucsd.edu
- Yu-Yen HuangStaff Process Development Engineer at IlluminaVerified email at utexas.edu