| Robust snapshot interferometric spectropolarimetry D Kim, Y Seo, Y Yoon, V Dembele, JW Yoon, KJ Lee, R Magnusson Optics Letters 41 (10), 2318-2321, 2016 | 28 | 2016 |
| One-piece polarizing interferometer for ultrafast spectroscopic polarimetry D Kim, V Dembele Scientific Reports 9 (1), 5978, 2019 | 20 | 2019 |
| Dynamic spectroscopic ellipsometry based on a one-piece polarizing interferometric scheme V Dembele, S Choi, W Chegal, I Choi, MJ Paul, J Kim, D Kim Optics Communications 454, 124426, 2020 | 18 | 2020 |
| Interferometric snapshot spectro-ellipsometry V Dembele, M Jin, I Choi, W Chegal, D Kim Optics Express 26 (2), 1333-1341, 2018 | 18 | 2018 |
| Dynamic spectro-polarimeter based on a modified Michelson interferometric scheme V Dembele, M Jin, BJ Baek, D Kim Optics Express 24 (13), 14419-14428, 2016 | 13 | 2016 |
| Normalized Hilbert Huang transform-NHHT applied to phase extraction in wavelet domain K Assid, F Alaoui, V Dembele, S Houmairi, M Sidki, A Nassim The Open Optics Journal 6 (1), 2012 | 8 | 2012 |
| Application of blind deblurring algorithm for face biometric F Alaoui, A Ghlaifan, D Vamara, N Abdelkarim International Journal of Computer Applications 105 (2), 2014 | 6 | 2014 |
| Dynamic spectroscopic imaging ellipsometry D Kim, V Dembele, S Choi, G Hwang, S Kheiryzadehkhanghah, C Joo, ... Optics Letters 47 (5), 1129-1132, 2022 | 5 | 2022 |
| Temperature measurement method based on Riesz transform method S Zada, S Darfi, V Dembele, S Rachafi, A Nassim International Scholarly Research Notices 2013, 2013 | 5 | 2013 |
| Application of blind deblurring algorithm for iris biometric F Alaoui, K Assid, V Dembele, A Nassim International Journal of Computer Applications 79 (3), 2013 | 4 | 2013 |
| High speed thin film thickness mapping by using dynamic spectroscopic imaging ellipsometry D Kim, V Dembele, S Choi, G Hwang, S Kheiryzadehkhanghah, I Choi, ... Optical Technology and Measurement for Industrial Applications Conference …, 2022 | 3 | 2022 |
| Robustness enhancement of dynamic spectroscopic ellipsometry by compensating temperature dependency of the monolithic polarizing interferometer I Choi, V Dembele, S Kheiryzadehkhanghah, G Hwang, B Charron, ... Applied Optics 61 (26), 7653-7661, 2022 | 3 | 2022 |
| Interferometric snapshot spectro-ellipsometry: calibration and systematic error analysis V Dembele, I Choi, S Kheiryzadehkhanghah, S Choi, J Kim, CS Kim, ... Current Optics and Photonics 4 (4), 345-352, 2020 | 3 | 2020 |
| Correlation properties of a spatially quasi-incoherent imaging interferometer V Dembele, J Wahl, M Sjödahl, K Ramser Applied Optics 61 (19), 5806-5812, 2022 | 2 | 2022 |
| Single frame fringe pattern analysis for phase recovery with analytic signal K Assid, V Dembele, F Alaoui, AK Nassim International Scholarly Research Notices 2012, 2012 | 2 | 2012 |
| Depth-resolved interferometric imaging utilizing a spatially quasi-incoherent light source V Dembele, J Wahl, M Sjödahl, K Ramser Digital Holography and Three-Dimensional Imaging, W7A. 1, 2022 | 1 | 2022 |
| Depth-resolved speckle correlation using quasi-incoherent imaging interferometry V Dembele, J Wahl, M Sjödahl, K Ramser Digital Holography and Three-Dimensional Imaging, DTu6H. 3, 2021 | 1 | 2021 |
| Thermal stability analysis of interferometric snapshot spectro-polarimeter I Choi, V Dembele, MJ Paul, S Choi, J Kim, BJ Baek, D Kim Journal of the Semiconductor & Display Technology 17 (3), 70-74, 2018 | 1 | 2018 |
| Squeezed Carrier Interferogram for Wavelet Phase Recovery V Dembele, K Assid, F Alaoui, AK Nassim International Journal of Optics and Applications 2 (4), 38-42, 2012 | 1 | 2012 |
| Squeezing interferometry for optical phase extraction in digital speckle pattern interferometry V Dembele, K Assid, F Alaoui, AK Nassim Int. J. Opt. Appl 2 (3), 29-33, 2012 | 1 | 2012 |
Daesuk KimProf. of Mechanical System Eng., Jeonbuk National UniversityVerified email at jbnu.ac.kr
