Variational autoencoder with implicit optimal priors H Takahashi, T Iwata, Y Yamanaka, M Yamada, S Yagi Proceedings of the AAAI Conference on Artificial Intelligence 33 (01), 5066-5073, 2019 | 69 | 2019 |
Student-t Variational Autoencoder for Robust Density Estimation. H Takahashi, T Iwata, Y Yamanaka, M Yamada, S Yagi IJCAI, 2696-2702, 2018 | 43 | 2018 |
Applying Auto-ID to the Japanese publication business to deliver advanced supply chain management, innovative retail applications, and convenient and safe reader services T Ishikawa, Y Yumoto, M Kurata, M Endo, S Kinoshita, F Hoshino, S Yagi, ... Auto-ID Center, Keio University, 2003 | 29 | 2003 |
Efficient Ising model mapping for induced subgraph isomorphism problems using Ising machines N Yoshimura, M Tawada, S Tanaka, J Arai, S Yagi, H Uchiyama, ... 2019 IEEE 9th International Conference on Consumer Electronics (ICCE-Berlin …, 2019 | 13 | 2019 |
Applying auto-id to the japanese publication business T Ishikawa, Y Yumoto, M Kurata, M Endo, S Kinoshita, F Hoshino, S Yagi, ... White Paper KEI-AUTOID-WH-004, Auto-ID Center, Keio University, Shonan …, 2003 | 10 | 2003 |
Mapping induced subgraph isomorphism problems to ising models and its evaluations by an ising machine N Yoshimura, M Tawada, S Tanaka, J Arai, S Yagi, H Uchiyama, ... IEICE TRANSACTIONS on Information and Systems 104 (4), 481-489, 2021 | 3 | 2021 |
A quasi-initial solution giving method for Ising machines by controlling external magnetic field coefficients S Kawakami, K Ohno, D Ba, S Yagi, J Teramoto, N Togawa 2023 IEEE International Conference on Consumer Electronics (ICCE), 1-6, 2023 | 2 | 2023 |
Detecting device, detecting method, and detecting program H Takahashi, T Iwata, Y Yamanaka, M Yamada, S Yagi US Patent App. 17/253,131, 2021 | 2 | 2021 |
An Evaluation Method of Combined Authentication Techniques Including Biometric Authentication Techniques I Ueno, S Yagi, J Yamada, T Kitagawa, H Takasugi IEICE Technical Report; IEICE Tech. Rep. 110 (372), 1-6, 2011 | 2 | 2011 |
Giving a quasi-initial solution to Ising machines by controlling external magnetic field coefficients S Kawakami, K Ohno, D Ba, S Yagi, J Teramoto, N Togawa IEICE Transactions on Fundamentals of Electronics, Communications and …, 2024 | 1 | 2024 |
Ising-machine-based solver for constrained graph coloring problems S Kawakami, Y Mukasa, S Bao, D Ba, J Arai, S Yagi, J Teramoto, ... IEICE Transactions on Fundamentals of Electronics, Communications and …, 2024 | 1 | 2024 |
A Constrained Graph Coloring Solver Based on Ising Machines S Kawakami, Y Mukasa, S Bao, D Ba, J Arai, S Yagi, J Teramoto, ... 2023 IEEE International Conference on Consumer Electronics (ICCE), 1-6, 2023 | 1 | 2023 |
Learning device, learning method, and learning program H Takahashi, T Iwata, S Kanai, A Kumagai, Y Yamanaka, M Yamada, ... US Patent App. 17/777,074, 2022 | 1 | 2022 |
An Interaction Coefficient Control Method for Setting Initial Solutions to Ising Machines S Kawakami, K Ohno, D Ba, S Yagi, J Teramoto, N Togawa 2024 IEEE International Conference on Consumer Electronics (ICCE), 1-2, 2024 | | 2024 |
Student-t Variational Autoencoder for Robust Multivariate Density EstimationStudent-t VAE によるロバスト確率密度推定 H Takahashi, T Iwata, Y Yamanaka, M Yamada, S Yagi, H Kashima | | 2021 |
Advanced Learning Technologies for Deep Learning Y Ida, S Kanai, Y Fujiwara, S Yagi, Y Iida NTT Technical Review 16 (8), 2018 | | 2018 |
An Architecture of A Multifactor Authentication Platform for Hybrid Cloud S Yagi, R Kasuga, S Imamura, J Yamada, H Takasugi IEICE Technical Report; IEICE Tech. Rep. 111 (81), 7-12, 2011 | | 2011 |
Development of Multifactor Authentication Platform with a Single Sign-On Function J Yamada, S Yagi, I Ueno, T Kitagawa, H Takasugi IEICE Technical Report; IEICE Tech. Rep. 110 (266), 47-52, 2010 | | 2010 |
Discription and Proccessing for Right to Use S Yagi, Y Sueda, M Ueno, H Takiguchi, H Kitami, T Kobayashi, Y Kondo IEICE Technical Report; IEICE Tech. Rep. 105 (357), 13-16, 2005 | | 2005 |
Ubuquitous Service Rights Management Protocol-- H Takiguchi, M Ueno, Y Sueda, S Yagi, H Kitami, T Kobayashi, Y Kondo IEICE Technical Report; IEICE Tech. Rep. 104 (690), 145-148, 2005 | | 2005 |