| Image processing procedures for analysis of electron back scattering patterns NCK Lassen, DJ Jensen, K Conradsen Scanning microscopy 6, 115-121, 1992 | 316 | 1992 |
| Image processing procedures for analysis of electron back scattering patterns NCK Lassen, DJ Jensen, K Conradsen Scanning microscopy 6, 115-121, 1992 | 311 | 1992 |
| On the statistical analysis of orientation data NC Krieger Lassen, D Juul Jensen, K Conradsen Acta Crystallographica Section A: Foundations of Crystallography 50 (6), 741-748, 1994 | 86 | 1994 |
| The relative precision of crystal orientations measured from electron backscattering patterns NC Krieger Lassen Journal of Microscopy 181 (1), 72-81, 1996 | 60 | 1996 |
| Heterogeneous deformation and recrystallisation of iron base oxide dispersion strengthened PM2000 alloy C Capdevila, YL Chen, NCK Lassen, AR Jones, H Bhadeshia Materials science and technology 17 (6), 693-699, 2001 | 58 | 2001 |
| Automatic high‐precision measurements of the location and width of Kikuchi bands in electron backscatter diffraction patterns K Lassen Journal of Microscopy 190 (3), 375-391, 1998 | 49 | 1998 |
| Automatic localisation of electron backscattering pattern bands from Hough transform NC Krieger Lassen Materials Science and Technology 12 (10), 837-843, 1996 | 46 | 1996 |
| Automatic recognition of deformed and recrystallized regions in partly recrystallized samples using electron back scattering patterns NC Krieger Lassen, D Juul Jensen, K Condradsen Materials Science Forum 157, 149-158, 1994 | 45 | 1994 |
| Application of high-energy synchrotron radiation for texture studies OV Mishin, EM Lauridsen, NC Krieger Lassen, G Brückner, ... Journal of applied crystallography 33 (2), 364-371, 2000 | 40 | 2000 |
| Source point calibration from an arbitrary electron backscattering pattern NC Krieger Lassen Journal of microscopy 195 (3), 204-211, 1999 | 37 | 1999 |
| Automated determination of crystal orientations from electron backscattering patterns NC Krieger Lassen Dänische Technische Universität Lyngby, Diss 8, 1994 | 31 | 1994 |
| Calibration of an electron back‐scattering pattern set‐up NCK Lassen, JB Bilde‐Sørensen Journal of Microscopy 170 (2), 125-129, 1993 | 29 | 1993 |
| Creating surface chemistry maps using multispectral vision technology JM Carstensen, ME Hansen, NK Lassen, PW Hansen, L Allé Proceedings of the MICCAI (Medical Image Computing and Computer Aided …, 2006 | 16 | 2006 |
| Automatic crystal orientation determination from EBSPs NCK Lassen Micron Microsc. Acta 23, 191-192, 1992 | 16 | 1992 |
| Automatic recognition of recrystallized grains in partly recrystallized samples from crystal orientation maps NCK Lassen, DJ Jensen 12th International Conference on Textures of Materials, 854-859, 1999 | 11 | 1999 |
| A new procedure for automatic high precision measurements of the position and width of bands in backscatter Kikuchi patterns NC Krieger Lassen Materials science forum 273, 201-208, 1998 | 8 | 1998 |
| Image processing procedures for analysis of electron back scattering patterns NC Krieger Lassen, D Juul Jensen, K Conradsen Scanning Microscopy 6 (1), 7, 1992 | 7 | 1992 |
| Development of an ultra-fast EBSD detector system M Søfferud, J Hjelen, M Karlsen, T Breivik, NC Krieger Lassen, ... EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen …, 2008 | 6 | 2008 |
| Automatic Local Texture Measurements by EBSP NCK Lassen, DJ Jensen Materials Science Forum 113, 679-684, 1993 | 5 | 1993 |
| Unsupervised approval criteria for automated EBSP investigation of deformed metals Godfrey, NCK Lassen Journal of Microscopy 197 (3), 249-259, 2000 | 3 | 2000 |
