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Dr Pankaj B Agarwal
Dr Pankaj B Agarwal
FIETE, SMIEEE, Senior Principal Scientist, CSIR-CEERI & Professor
Verified email at ceeri.res.in - Homepage
Title
Cited by
Cited by
Year
Flexible NO2 gas sensor based on single-walled carbon nanotubes on polytetrafluoroethylene substrates
PB Agarwal, B Alam, DS Sharma, S Mandal, A Agarwal
Flexible and Printed Electronics 3 (3), 035001, 2018
552018
Efficiency enhancement of silicon solar cells with silicon nanocrystals embedded in PECVD silicon nitride matrix
WR Taube, A Kumar, R Saravanan, PB Agarwal, P Kothari, BC Joshi, ...
Solar Energy Materials and Solar Cells 101, 32-35, 2012
432012
Room Temperature Single Walled Carbon Nanotubes (SWCNT) Chemiresistive Ammonia Gas Sensor
BS Dasari, WR Taube, PB Agarwal, M Rajput, A Kumar, J Akhtar
Sensors & Transducers Journal 190 (7), 24-30, 2015
362015
Ultrathin Films of Single-Walled Carbon Nanotubes: A Potential Methane Gas Sensor
M Poonia, V Manjuladevi, RK Gupta, SK Gupta, J Singh, PB Agarwal, ...
Science of Advanced Materials 6, 1-8, 2014
322014
A Comprehensive Review on MEMS-based Viscometers
P Singh, K Sharma, I Puchades, PB Agarwal
Sensors and Actuators A: Physical, 113456, 2022
212022
Design and simulation of octal-to-binary encoder using capacitive single-electron transistors (C-SETs)
PB Agarwal, A Kumar
Microelectronics Journal 42 (1), 96-100, 2011
212011
Reusable silicon shadow mask with sub-5 μm gap for low cost patterning
PB Agarwal, S Pawar, SM Reddy, P Mishra, A Agarwal
Sensors and Actuators A: Physical 242, 67-72, 2016
202016
Ammonia Sensing by PANI-DBSA Based Gas Sensor exploiting Kelvin Probe Technique, Journal of Nanoparticles
A Yadav, A Agarwal, A Pankaj B, P Saini
Journal of Nanoparticles 2015, 2015
142015
Plasma enhanced chemical vapor deposited (PECVD) silicon-rich-nitride thin films for improving silicon solar cells efficiency
A Kumar, WR Taube, R Sarvanan, PB Agarwal, P Kothari, D Kumar
International Journal of Scientific Engineering and Technology 1 (4), 111-116, 2012
122012
CMOS compatible pyroelectric materials for infrared detectors
Ranu, B Uthra, R Sinha, PB Agarwal
Materials Science in Semiconductor Processing 140, 106375, 2022
92022
Silicon Shadow Mask Technology for Aligning and In Situ Sorting of Semiconducting SWNTs for Sensitivity Enhancement: A Case Study of NO2 Gas Sensor
PB Agarwal, R Sharma, D Mishra, NK Thakur, A Agarwal, A Ajayaghosh
ACS Applied Materials & Interfaces 12 (36), 40901-40909, 2020
72020
Silver Nanoparticles in Comparison with Ionic Liquid and rGO as Gate Dopant for Paper–Pencil-Based Flexible Field-Effect Transistors
S Mandal, R Kumar, A Nagahanumaiah, N Chandra, ...
Journal of Electronic Materials 44 (1), 6-12, 2014
72014
Nano-arrays of SAM by dip-pen nanowriting (DPN) technique for futuristic bio-electronic and bio-sensor applications
PB Agarwal, A Kumar, R Saravanan, AK Sharma, C Shekhar
Thin Solid Films 519 (3), 1025-1027, 2010
72010
Effect of lanthanide dopants on stability of orthorhombic hafnium oxide for pyroelectric applications
B Uthra, V Bang, SSV Anantha, PB Agarwal
Materials Letters 317, 132097, 2022
62022
Reliability Analysis of CNT Contacts With Metal Electrodes
R Prajesh, PB Agarwal, A Agarwal
BioNanoScience 2, 223-226, 2012
52012
Optimization of oxygen plasma based etching of single layered graphene through Raman and FESEM characterization
PB Agarwal, P Paulchowdhury, A Mukherjee, P Lohani, NK Thakur
Materials Today: Proceedings 48, 616-618, 2022
42022
Chemical-free and scalable process for the fabrication of a uniform array of liquid-gated CNTFET, evaluated by KCl electrolyte
PB Agarwal, NK Thakur, R Sharma, P Singh, J Joseph, C Tripura
Scientific Reports 11 (1), 3979, 2021
32021
Stable metal-CNT contacts using shadow mask technique for CNTFET fabrication
PB Agarwal, AK Singh, A Agarwal
AIP Conference Proceedings 1989 (1), 2018
32018
Comparative study of SWNTs dispersion in organic solvent and surfactant along with observation of multilayer Graphene
G Kanwar, PB Agarwal, S Yadav
Physics of Semiconductor Devices: 17th International Workshop on the Physics …, 2014
32014
Finite element simulation-based prediction of CMOS-compatible pyroelectric material in MEMS IR detectors
PB Agarwal
Microelectronics Reliability 147, 115076, 2023
22023
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