Arnold Jan (Arjan) den Dekker
TitleCited byYear
Maximum-likelihood estimation of Rician distribution parameters
J Sijbers, AJ den Dekker, P Scheunders, D Van Dyck
IEEE Transactions on Medical Imaging 17 (3), 357-361, 1998
4271998
Resolution: a survey
AJ Den Dekker, A Van den Bos
JOSA A 14 (3), 547-557, 1997
3651997
Estimation of the noise in magnitude MR images
J Sijbers, AJ Den Dekker, J Van Audekerke, M Verhoye, D Van Dyck
Magnetic Resonance Imaging 16 (1), 87-90, 1998
3081998
Maximum likelihood estimation of signal amplitude and noise variance from MR data
J Sijbers, AJ Den Dekker
Magnetic Resonance in Medicine: An Official Journal of the International …, 2004
3062004
Optimal experimental design for diffusion kurtosis imaging
DHJ Poot, AJ den Dekker, E Achten, M Verhoye, J Sijbers
IEEE transactions on medical imaging 29 (3), 819-829, 2010
1612010
Automatic estimation of the noise variance from the histogram of a magnetic resonance image
J Sijbers, D Poot, AJ den Dekker, W Pintjens
Physics in Medicine & Biology 52 (5), 1335, 2007
1612007
Parameter estimation from magnitude MR images
J Sijbers, AJ den Dekker, E Raman, D Van Dyck
International Journal of imaging systems and technology 10 (2), 109-114, 1999
1231999
Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part I: A theoretical framework
AJ Den Dekker, S Van Aert, A Van den Bos, D Van Dyck
Ultramicroscopy 104 (2), 83-106, 2005
862005
Adaptive anisotropic noise filtering for magnitude MR data
J Sijbers, AJ den Dekker, A Van der Linden, M Verhoye, D Van Dyck
Magnetic resonance imaging 17 (10), 1533-1539, 1999
821999
Advanced image processing in magnetic resonance imaging
L Landini, V Positano, M Santarelli
CRC press, 2018
662018
Resolution of coherent and incoherent imaging systems reconsidered-Classical criteria and a statistical alternative
S Van Aert, D Van Dyck, AJ den Dekker
Optics express 14 (9), 3830-3839, 2006
662006
Parametric Bayesian filters for nonlinear stochastic dynamical systems: A survey
P Stano, Z Lendek, J Braaksma, R Babuška, C de Keizer, AJ den Dekker
IEEE transactions on cybernetics 43 (6), 1607-1624, 2013
522013
Model-based two-object resolution from observations having counting statistics
E Bettens, D Van Dyck, AJ Den Dekker, J Sijbers, A Van den Bos
Ultramicroscopy 77 (1-2), 37-48, 1999
511999
Estimation of signal and noise from Rician distributed data
J Sijbers, AJ Den Dekker, D Van Dyck, E Raman
Proceedings of the international Conference on Signal Processing and …, 1998
511998
Data distributions in magnetic resonance images: A review
AJ Den Dekker, J Sijbers
Physica Medica 30 (7), 725-741, 2014
502014
Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part II: a practical example
S Van Aert, AJ Den Dekker, A Van Den Bos, D Van Dyck, JH Chen
Ultramicroscopy 104 (2), 107-125, 2005
502005
Optimal experimental design of STEM measurement of atom column positions
S Van Aert, AJ Den Dekker, D Van Dyck, A Van Den Bos
Ultramicroscopy 90 (4), 273-289, 2002
482002
Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures?
D Van Dyck, S Van Aert, AJ den Dekker, A Van den Bos
Ultramicroscopy 98 (1), 27-42, 2003
472003
High-resolution electron microscopy and electron tomography: resolution versus precision
S Van Aert, AJ den Dekker, D Van Dyck, A Van Den Bos
Journal of Structural Biology 138 (1-2), 21-33, 2002
442002
Resolution reconsidered—Conventional approaches and an alternative
A Van den Bos, AJ Den Dekker
Advances in imaging and electron physics 117, 241-360, 2001
402001
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Articles 1–20