Lucille A. Giannuzzi
Lucille A. Giannuzzi
President, L.A. Giannuzzi & Associates LLC, EXpressLO LLC
Verified email at lagiannuzzi.com - Homepage
Title
Cited by
Cited by
Year
Introduction to focused ion beams: instrumentation, theory, techniques and practice
LA Giannuzzi
Springer Science & Business Media, 2004
13312004
A review of focused ion beam milling techniques for TEM specimen preparation
LA Giannuzzi, FA Stevie
Micron 30 (3), 197-204, 1999
12521999
TEM sample preparation and FIB-induced damage
J Mayer, LA Giannuzzi, T Kamino, J Michael
MRS bulletin 32 (5), 400-407, 2007
7622007
High-temperature interface superconductivity between metallic and insulating copper oxides
A Gozar, G Logvenov, LF Kourkoutis, AT Bollinger, LA Giannuzzi, ...
Nature 455 (7214), 782-785, 2008
5112008
Site-specific 3D imaging of cells and tissues with a dual beam microscope
JAW Heymann, M Hayles, I Gestmann, LA Giannuzzi, B Lich, ...
Journal of structural biology 155 (1), 63-73, 2006
3292006
Applications of the FIB lift‐out technique for TEM specimen preparation
LA Giannuzzi, JL Drown, SR Brown, RB Irwin, FA Stevie
Microscopy research and technique 41 (4), 285-290, 1998
2571998
Focused ion beam milling: A method of site-specific sample extraction for microanalysis of Earth and planetary materials
PJ Heaney, EP Vicenzi, LA Giannuzzi, KJT Livi
American Mineralogist 86 (9), 1094-1099, 2001
2132001
Focused ion beam milling and micromanipulation lift-out for site specific cross-section TEM specimen preparation
LA Giannuzzi, JL Drown, SR Brown, RB Irwin, FA Stevie
MRS Online Proceedings Library (OPL) 480, 1997
1991997
High strength and high modulus carbon fibers
HG Chae, BA Newcomb, PV Gulgunje, Y Liu, KK Gupta, MG Kamath, ...
Carbon 93, 81-87, 2015
1502015
2 keV Ga+ FIB milling for reducing amorphous damage in silicon
LA Giannuzzi, R Geurts, J Ringnalda
Microscopy and Microanalysis 11 (S02), 828-829, 2005
1232005
The correlation between ion beam/material interactions and practical FIB specimen preparation
BI Prenitzer, CA Urbanik-Shannon, LA Giannuzzi, SR Brown, RB Irwin, ...
Microscopy and Microanalysis 9 (3), 216, 2003
1202003
Application of focused ion beam lift‐out specimen preparation to TEM, SEM, STEM, AES and SIMS analysis
FA Stevie, CB Vartuli, LA Giannuzzi, TL Shofner, SR Brown, B Rossie, ...
Surface and Interface Analysis: An International Journal devoted to the …, 2001
1152001
Ion channeling effects on the focused ion beam milling of Cu
BW Kempshall, SM Schwarz, BI Prenitzer, LA Giannuzzi, RB Irwin, ...
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2001
1102001
FIB lift-out specimen preparation techniques
LA Giannuzzi, BW Kempshall, SM Schwarz, JK Lomness, BI Prenitzer, ...
Introduction to focused ion beams, 201-228, 2005
1072005
Recent advances in focused ion beam technology and applications
N Bassim, K Scott, LA Giannuzzi
Mrs Bulletin 39 (4), 317-325, 2014
1012014
Two-dimensional and 3-dimensional analysis of bone/dental implant interfaces with the use of focused ion beam and electron microscopy
LA Giannuzzi, D Phifer, NJ Giannuzzi, MJ Capuano
Journal of Oral and Maxillofacial Surgery 65 (4), 737-747, 2007
922007
Transmission electron microscope specimen preparation of Zn powders using the focused ion beam lift-out technique
BI Prenitzer, LA Giannuzzi, K Newman, SR Brown, RB Irwin, FA Stevie, ...
Metallurgical and Materials Transactions A 29 (9), 2399-2406, 1998
921998
Electron backscattering diffraction investigation of focused ion beam surfaces
TL Matteson, SW Schwarz, EC Houge, BW Kempshall, LA Giannuzzi
Journal of Electronic Materials 31 (1), 33-39, 2002
902002
Wet thermal oxidation of GaN
ED Readinger, SD Wolter, DL Waltemyer, JM Delucca, SE Mohney, ...
Journal of electronic materials 28 (3), 257-260, 1999
801999
Comparative evaluation of protective coatings and focused ion beam chemical vapor deposition processes
BW Kempshall, LA Giannuzzi, BI Prenitzer, FA Stevie, SX Da
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2002
752002
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