| Multiple fault diagnosis based on multiple fault simulation using particle swarm optimization S Kundu, S Chattopadhyay, I Sengupta, R Kapur 2011 24th Internatioal Conference on VLSI Design, 364-369, 2011 | 33 | 2011 |
| Scan chain masking for diagnosis of multiple chain failures in a space compaction environment S Kundu, S Chattopadhyay, I Sengupta, R Kapur IEEE Transactions on Very Large Scale Integration (VLSI) Systems 23 (7 …, 2014 | 21 | 2014 |
| Fault diagnosis in designs with extreme low pin test data compressors S Kundu, P Bhattacharya, R Kapur 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2015 | 17 | 2015 |
| Customizing pattern set for test power reduction via improved X-identification and reordering SK Kumar, S Kaundinya, S Kundu, S Chattopadhyay Proceedings of the 16th ACM/IEEE international symposium on Low power …, 2010 | 17 | 2010 |
| Thermal aware don't care filling to reduce peak temperature and thermal variance during testing A Dutta, S Kundu, S Chattopadhyay 2013 22nd Asian Test Symposium, 25-30, 2013 | 14 | 2013 |
| Efficient don't care filling for power reduction during testing S Kundu, S Chattopadhyay 2009 International Conference on Advances in Recent Technologies in …, 2009 | 13 | 2009 |
| An ATE assisted DFD technique for volume diagnosis of scan chains S Kundu, S Chattopadhyay, I Sengupta, R Kapur Proceedings of the 50th Annual Design Automation Conference, 1-6, 2013 | 10 | 2013 |
| A metric for test set characterization and customization toward fault diagnosis S Kundu, S Pal, S Chattopadhyay, I Sengupta, R Kapur IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2013 | 8 | 2013 |
| Test pattern selection and customization targeting reduced dynamic and leakage power consumption S Kundu, S Chattopadhyay 2009 Asian Test Symposium, 307-312, 2009 | 8 | 2009 |
| Particle swarm optimization based vector reordering for low power testing SK Kumar, S Kaundinya, S Kundu, S Chattopadhyay 2010 Second International conference on Computing, Communication and …, 2010 | 7 | 2010 |
| A novel technique to reduce both leakage and peak power during scan testing S Kundu, S Chattopadhyay, K Manna 2008 IEEE Region 10 and the Third international Conference on Industrial and …, 2008 | 7 | 2008 |
| Using custom fault models to improve understanding of silicon failures S Kundu, G Bhargava, L Endrinal, L Ranganathan 2022 IEEE International Test Conference (ITC), 348-354, 2022 | 5 | 2022 |
| Customizing completely specified pattern set targeting dynamic and leakage power reduction during testing SK Kumar, S Kundu, S Chattopadhyay Integration 45 (2), 211-221, 2012 | 5 | 2012 |
| Test vector reordering to reduce peak temperature during testing A Dutta, S Kundu, S Chattopadhyay 2013 Annual IEEE India Conference (INDICON), 1-6, 2013 | 4 | 2013 |
| A technology specific approach to reduce leakage SN Pradhan, S Kundu, S Chattopadhyay IEEE VDT Chandigarh, 2010 | 4 | 2010 |
| Mapping physical shift failures to scan cells for detecting physical faults in integrated circuits S Kundu, P Bhattacharya, R Kapur US Patent 10,605,863, 2020 | 3 | 2020 |
| Diagnosis techniques for identifying faults in digital VLSI circuits S Kundu | 3 | 2015 |
| Aggresive scan chain masking for improved diagnosis of multiple scan chain failures S Kundu, S Chattopadhyay, I Sengupta, R Kapur 2013 18th IEEE European Test Symposium (ETS 2013), 1-1, 2013 | 3 | 2013 |
| A diagnosability metric for test set selection targeting better fault detection S Kundu, S Chattopadhyay, I Sengupta, R Kapur 2012 25th International Conference on VLSI Design, 436-441, 2012 | 3 | 2012 |
| Scan-chain masking technique for low power circuit testing S Kundu, S Chattopadhyay 2009 1st Asia Symposium on Quality Electronic Design, 183-188, 2009 | 3 | 2009 |
