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Subhadip Kundu
Subhadip Kundu
Verified email at qti.qualcomm.com
Title
Cited by
Cited by
Year
Multiple fault diagnosis based on multiple fault simulation using particle swarm optimization
S Kundu, S Chattopadhyay, I Sengupta, R Kapur
2011 24th Internatioal Conference on VLSI Design, 364-369, 2011
322011
Scan chain masking for diagnosis of multiple chain failures in a space compaction environment
S Kundu, S Chattopadhyay, I Sengupta, R Kapur
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 23 (7 …, 2014
212014
Fault diagnosis in designs with extreme low pin test data compressors
S Kundu, P Bhattacharya, R Kapur
2015 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2015
172015
Customizing pattern set for test power reduction via improved X-identification and reordering
SK Kumar, S Kaundinya, S Kundu, S Chattopadhyay
Proceedings of the 16th ACM/IEEE international symposium on Low power …, 2010
172010
Thermal aware don't care filling to reduce peak temperature and thermal variance during testing
A Dutta, S Kundu, S Chattopadhyay
2013 22nd Asian Test Symposium, 25-30, 2013
142013
Efficient don't care filling for power reduction during testing
S Kundu, S Chattopadhyay
2009 International Conference on Advances in Recent Technologies in …, 2009
132009
An ATE assisted DFD technique for volume diagnosis of scan chains
S Kundu, S Chattopadhyay, I Sengupta, R Kapur
Proceedings of the 50th Annual Design Automation Conference, 1-6, 2013
102013
A metric for test set characterization and customization toward fault diagnosis
S Kundu, S Pal, S Chattopadhyay, I Sengupta, R Kapur
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2013
82013
Test pattern selection and customization targeting reduced dynamic and leakage power consumption
S Kundu, S Chattopadhyay
2009 Asian Test Symposium, 307-312, 2009
82009
Particle swarm optimization based vector reordering for low power testing
SK Kumar, S Kaundinya, S Kundu, S Chattopadhyay
2010 Second International conference on Computing, Communication and …, 2010
72010
A novel technique to reduce both leakage and peak power during scan testing
S Kundu, S Chattopadhyay, K Manna
2008 IEEE Region 10 and the Third international Conference on Industrial and …, 2008
72008
Customizing completely specified pattern set targeting dynamic and leakage power reduction during testing
SK Kumar, S Kundu, S Chattopadhyay
Integration 45 (2), 211-221, 2012
52012
Using custom fault models to improve understanding of silicon failures
S Kundu, G Bhargava, L Endrinal, L Ranganathan
2022 IEEE International Test Conference (ITC), 348-354, 2022
42022
Test vector reordering to reduce peak temperature during testing
A Dutta, S Kundu, S Chattopadhyay
2013 Annual IEEE India Conference (INDICON), 1-6, 2013
42013
A technology specific approach to reduce leakage
SN Pradhan, S Kundu, S Chattopadhyay
IEEE VDT Chandigarh, 2010
42010
Mapping physical shift failures to scan cells for detecting physical faults in integrated circuits
S Kundu, P Bhattacharya, R Kapur
US Patent 10,605,863, 2020
32020
Diagnosis techniques for identifying faults in digital VLSI circuits
S Kundu
32015
Aggresive scan chain masking for improved diagnosis of multiple scan chain failures
S Kundu, S Chattopadhyay, I Sengupta, R Kapur
2013 18th IEEE European Test Symposium (ETS 2013), 1-1, 2013
32013
A diagnosability metric for test set selection targeting better fault detection
S Kundu, S Chattopadhyay, I Sengupta, R Kapur
2012 25th International Conference on VLSI Design, 436-441, 2012
32012
Scan-chain masking technique for low power circuit testing
S Kundu, S Chattopadhyay
2009 1st Asia Symposium on Quality Electronic Design, 183-188, 2009
32009
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