| Effect of pressure on intersubband optical absorption coefficients and refractive index changes in a V-groove quantum wire R Khordad, SK Khaneghah, M Masoumi Superlattices and Microstructures 47 (4), 538-549, 2010 | 69 | 2010 |
| Intersubband optical absorption coefficients and refractive index changes in a V‐groove quantum wire R Khordad, SK Khaneghah physica status solidi (b) 248 (1), 243-249, 2011 | 25 | 2011 |
| Dynamic spectroscopic imaging ellipsometry D Kim, V Dembele, S Choi, G Hwang, S Kheiryzadehkhanghah, C Joo, ... Optics Letters 47 (5), 1129-1132, 2022 | 5 | 2022 |
| Robust dynamic spectroscopic imaging ellipsometer based on a monolithic polarizing Linnik interferometer G Hwang, I Choi, S Choi, S Kheiryzadehkhanghah, W Chegal, S Kim, ... Optics Express 31 (12), 19569-19587, 2023 | 4 | 2023 |
| High speed thin film thickness mapping by using dynamic spectroscopic imaging ellipsometry D Kim, V Dembele, S Choi, G Hwang, S Kheiryzadehkhanghah, I Choi, ... Optical Technology and Measurement for Industrial Applications Conference …, 2022 | 3 | 2022 |
| Robustness enhancement of dynamic spectroscopic ellipsometry by compensating temperature dependency of the monolithic polarizing interferometer I Choi, V Dembele, S Kheiryzadehkhanghah, G Hwang, B Charron, ... Applied Optics 61 (26), 7653-7661, 2022 | 3 | 2022 |
| Interferometric snapshot spectro-ellipsometry: calibration and systematic error analysis V Dembele, I Choi, S Kheiryzadehkhanghah, S Choi, J Kim, CS Kim, ... Current Optics and Photonics 4 (4), 345-352, 2020 | 3 | 2020 |
| Dynamic ultra-thin film thickness line-profile extraction from a warped Si substrate S Kheiryzadehkhanghah, G Hwang, I Choi, S Choi, D Kim Metrology, Inspection, and Process Control XXXVIII 12955, 246-249, 2024 | | 2024 |
| Dynamic spectroscopic imaging ellipsometer for high-throughput full patterned wafer mapping G Hwang, S Kheiryzadehkhanghah, S Choi, I Choi, S Kim, D Kim Metrology, Inspection, and Process Control XXXVIII 12955, 45-49, 2024 | | 2024 |
| High speed 2D material visualization by using a microscopic dynamic spectroscopic imaging ellipsometer S Choi, G Hwang, S Kheiryzadehkhanghah, I Choi, W Chegal, Y Cho, ... Metrology, Inspection, and Process Control XXXVIII 12955, 59-61, 2024 | | 2024 |
| 일체형 분광편광간섭모듈 기반분광타원편광계의 정확도 향상 G Hwang, J Shim, I Choi, S Choi, S Kheiryzadehkhanghah, D Kim 반도체디스플레이기술학회지 제 22 (3), 2023 | | 2023 |
| Full Stokes polarimetry using a monolithic off-axis polarizing interferometer and a 2D array sensor S Kheiryzadehkhanghah, V Dembele, G Hwang, J Shim, I Choi, S Choi, ... Applied Optics 62 (8), 1943-1951, 2023 | | 2023 |
| Stability enhancement of dynamic spectroscopic polarimeter DK I Choi, S Kheiryzadehkhanghah, S Choi, G Hwang, J Sim the 9th international conference on spectroscopic ellipsometry (ICSE-9) in …, 2022 | | 2022 |
| High throughput dynamic spectroscopic ellipsometry DK G. Hwang , V. Dembele , S. Choi , I. Choi , J. Sim , S ... the 9th international conference on spectroscopic ellipsometry (ICSE-9) in …, 2022 | | 2022 |
| Speed enhancement of dynamic spectroscopic ellipsometry by using direct spectral phase extraction method V Dembele, S Kheiryzadehkhanghah, G Hwang, D Kim Applied Optics 60 (35), 10867-10872, 2021 | | 2021 |
| Large scale thin film thickness uniformity extraction based on dynamic spectroscopic ellipsometry D Kim, G Hwang, S Choi, V Dembele, S Kheiryzadehkhanghah, I Choi, ... Optical Technology and Measurement for Industrial Applications Conference …, 2021 | | 2021 |
| Speed enhancement of interferometric snapshot ellipsometry using a direct filtering phase method V Dembele, I Choi, S Kheiryzadehkhanghah, D Kim Modeling Aspects in Optical Metrology VIII 11783, 72-75, 2021 | | 2021 |
| Long-term Stability Optimization of Dynamic Spectroscopic Ellipsometery based on Dual-wavelength Calibration I Choi, S Kheiryzadehkhanghah, S Choi, G Hwang, J Shim, D Kim Journal of the Semiconductor & Display Technology 20 (3), 178-183, 2021 | | 2021 |
| Highly Robust Snapshot Interferometric Spectro-Ellipsometry DK Vamara Dembele, Sukhyun Choi, Inho Choi, Saeid Kheiryzadehkhanghah ... 8th International Conference on Spectroscopic Ellipsometry (ICSE-8 …, 2019 | | 2019 |
| Study of Linear and Non-linear Optical Absorption in Nanostructures AG Saeid Kheiryzadehkhanghah, Reza Khordad PAYAME NOOR UNIVERSITY, Department of Physics, 2010 | | 2010 |
Daesuk KimProf. of Mechanical System Eng., Jeonbuk National UniversityVerified email at jbnu.ac.kr
