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Dr. Pratikhya Raut
Dr. Pratikhya Raut
Assistant Professor in dept.of ECE at VR Siddhartha autonomous Engineering College
Verified email at vitap.ac.in
Title
Cited by
Cited by
Year
RF and linearity parameter analysis of junction-less gate all around (JLGAA) MOSFETs and their dependence on gate work function
P Raut, U Nanda
Silicon 14 (10), 5427-5435, 2022
332022
RF with linearity and non-linearity parameter analysis of gate all around negative capacitance junction less FET (GAA-NC-JLFET) for different ferroelectric thickness
P Raut, U Nanda, DK Panda
Physica Scripta 97 (10), 105809, 2022
152022
A charge-based analytical model for gate all around junction-less field effect transistor including interface traps
P Raut, U Nanda
ECS Journal of Solid State Science and Technology 11 (5), 051006, 2022
122022
Recent trends on junction-less field effect transistors in terms of device topology, modeling, and application
P Raut, U Nanda, DK Panda
ECS Journal of Solid State Science and Technology, 2023
92023
Analytical drain current model development of twin gate TFET in subthreshold and super threshold regions
P Raut, U Nanda, DK Panda
Microelectronics Journal 135, 105761, 2023
42023
Performance Analysis of Double Gate Junctionless TFET with respect to different high-k materials and oxide thickness
P Raut, U Nanda, DK Panda, HPT Nguyen
2022 2nd International Conference on Artificial Intelligence and Signal …, 2022
32022
Design and Modeling of a Label-free JLTFETBased Biosensor for Enhanced Sensitivity
P Raut, U Nanda, DK Panda
2023 IEEE Devices for Integrated Circuit (DevIC), 77-81, 2023
12023
Analysis of RF with DC and Linearity Parameter and Study of Noise Characteristics of Gate‐All‐Around Junctionless FET (GAA‐JLFET) and Its Applications
P Raut, U Nanda, DK Panda
Nanodevices for Integrated Circuit Design, 93-115, 2023
2023
Design and Comparison of Wideband Cascode Low Noise Amplifier using GAA-JLFET and GAA-NC-JLFET for RFIC Applications
P Raut, U Nanda, DK Panda, CC Hsu
2023 3rd International conference on Artificial Intelligence and Signal …, 2023
2023
Impact of post metal annealing on gate work function engineering for advanced MOS applications
SS Kumar, A Prasad, A Sinha, P Raut, P Das, SS Mahato, S Mallik
AIP Conference Proceedings 1728 (1), 2016
2016
FETs for Advanced, Ultra-Scaled Technologies
P Raut, U Nanda, DK Panda, S Barraud, B Previtali, V Lapras
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Articles 1–11