| Optimization of direct tunneling gate leakage current in ultrathin gate oxide FET with high-K dielectrics S Chander, P Singh, S Baishya International Journal of Recent Development in Engineering and Technology 1 …, 2013 | 12 | 2013 |
| Performance reliability of ultra-thin Si-SiO2, Si-Al2O3, Si-ZrO2 and Si-HfO2 interface in rectangular steep retrograded nano-regimes devices RR Thakur, P Singh Microelectronics Reliability 96, 21-28, 2019 | 8 | 2019 |
| Q-FinFET: The Next Generation FinFET RR Thakur, P Singh Journal of Nanoelectronics and Optoelectronics 14 (1), 92-98, 2019 | 7 | 2019 |
| Hardware implementation of adaptive feedback based reversible image watermarking for image processing application S Das, P Singh, C Koley Microsystem Technologies, 1-17, 2018 | 5 | 2018 |
| Investigations of Interface Trap Densities (Dit) and Interface Charges (Qit) for Steep Retrograded Al2O3 and HfO2 based Nano Regime GAA FinFETs RR Thakur, P Singh Materials Today: Proceedings 24, 2011-2018, 2020 | 3 | 2020 |
| Physics & Modeling of Ambipolar Snapback Behavior in Gate Grounded NMOS P Singh, RS Dhar, S Baishya Silicon, 1-11, 2021 | 2 | 2021 |
| Study of Carrier Scattering and Quantization Effects in Steep Retrograded Gate All Around FinFETs for Nano Technology Applications RR Thakur, P Singh Materials Today: Proceedings 24, 2024-2029, 2020 | 2 | 2020 |
| Analysis of interface trap charges and densities using capacitance-voltage (CV) and conductance voltage (GV) methods in steep retrograded Al2O3, ZrO2 and HfO2 based gate all … RR Thakur, P Singh AIP Conference Proceedings 2009 (1), 020053, 2018 | 2 | 2018 |
| Effects of Interface Charge (Qit) and Interface Trap Density (Dit) on A12O3, ZrO2and HfO2based Nano Regime Multi-Gate Devices RR Thakur, P Singh 2018 4th International Conference on Devices, Circuits and Systems (ICDCS …, 2018 | 2 | 2018 |
| Micro-features of ambipolar snapback behaviour under high current injection to design capacitorless memory device P Singh, RS Dhar, S Baishya Physica Scripta 96 (12), 124069, 2021 | 1 | 2021 |
| Features of Snapback in Compact Memory Devices For High Performance Integrated Circuits P Singh, RS Dhar, S Baishya 2021 Devices for Integrated Circuit (DevIC), 397-400, 2021 | 1 | 2021 |
| Study of Carrier Scattering and Quantization Effects in Steep Retrograded Double Gate FinFETs for Nano Technology Applications RR Thakur, P Singh Materials Today: Proceedings 24, 2019-2023, 2020 | 1 | 2020 |
| Study of Suppressed Carrier Scattering Effects and Carrier Quantization in Tri-Gate FinFET for SoC Applications RR Thakur, P Singh, S Swaraj 2018 3rd IEEE International Conference on Recent Trends in Electronics …, 2018 | 1 | 2018 |
| Study of Quantization and Carrier Scattering Effects in SOI Tri-Gate FinFET for SoC Applications RR Thakur, P Singh, SS Kiran, AK Singh 2018 2nd International Conference on Trends in Electronics and Informatics …, 2018 | 1 | 2018 |
| Comparison of Snapback Phenomenon and Physics in Bottom and Top Body Contact NMOS P Singh, NP Maity, RS Dhar, S Baishya Microelectronics, Circuits and Systems: Select Proceedings of Micro2021, 25-33, 2023 | | 2023 |
| Bipolar effects in snapback mechanism in advanced n-FET transistors under high current stress conditions P Singh, RS Dhar, S Baishya, A Chatterjee Journal of Physics Communications 4 (6), 065009, 2020 | | 2020 |
| Design of Folded Cascode Amplifier for SCL 180 nm Technology Node for Low Power Applications RR Thakur, P Singh, C Koley Journal of Network Security 8 (1), 22-31, 2020 | | 2020 |
| A Comparative analysis of steep retrograde and uniform doping for high-k dielectrics based multi-gate devices RR Thakur, P Singh Carbon – Science and Technology 10 (4), 87-94, 2018 | | 2018 |
| A Comparative Study between the Difference Expansion based Reversible Image Watermarking and Adaptive Feedback based Reversible Image Watermarking: CK Subhajit Das, Divya Sharma, Ajay Kumar, G. Vishnu Vardhan Reddy, Pragati ... 4th International Conference on "Microelectronics, Circuits and Systems …, 2017 | | 2017 |
| Analysis of the Interface Trap Properties in Ultra-thin Al2O3 and HfO2 based Double Gate FinFETs RRTP Singh International Conference on Electrical, Electronics, Computers …, 0 | | |
