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Jungsoo Kim
Jungsoo Kim
SAMSUNG SDI
Verified email at samsung.com
Title
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Cited by
Year
Effect of Ni(P) thickness in Au/Pd/Ni(P) surface finish on the electrical reliability of Sn-3.0Ag-0.5Cu solder joints during current-stressing
J Kim, SB Jung, JW Yoon
Journal of Alloys and Compounds 850 (1), 156729, 2021
272021
Electromigration behaviors of Sn58% Bi solder containing Ag-coated MWCNTs with OSP surface finished PCB
J Kim, KH Jung, JH Kim, CJ Lee, SB Jung
Journal of Alloys and Compounds 775, 581-588, 2019
262019
Effects of crystalline and amorphous Pd layers on initial interfacial reactions at Sn-3.0Ag-0.5Cu/thin-Au/Pd/Ni(P) solder joints
J Kim, SB Jung, JW Yoon
Applied surface science 503, 144339, 2020
222020
Effects of aging treatment on mechanical properties of Sn-58Bi epoxy solder on ENEPIG-surface-finished PCB
J Kim, WR Myung, SB Jung
Journal of electronic materials 45, 5895-5903, 2016
202016
Optimal Ni (P) thickness and reliability evaluation of thin-Au/Pd (P)/Ni (P) surface-finish with Sn-3.0 Ag-0.5 Cu solder joints
J Kim, SB Jung, JW Yoon
Journal of Alloys and Compounds 805 (1), 1013-1024, 2019
182019
Effects of a phosphorous-containing Pd layer in a thin-ENEPIG surface finish on the interfacial reactions and mechanical strength of a Sn–58Bi solder joint
J Kim, SB Jung, JW Yoon
Journal of Alloys and Compounds 820, 153396, 2020
152020
Effect of Aging treatment and Epoxy on Bonding Strength of Sn-58Bi solder and OSP-finished PCB
J Kim, WR Myung, SB Jung
Journal of the Microelectronics and Packaging Society 21 (4), 97-103, 2014
112014
Interfacial Reactions and Mechanical Properties of Sn–58Bi Solder Joints with Ag Nanoparticles Prepared Using Ultra-Fast Laser Bonding
YHK G. Jeong, D. Y. Yu, S. Baek, J. Bang, T. I. Lee, S. B. Jung, J. Kim
Materials, 2021
102021
Interfacial reactions and mechanical properties of transient liquid-phase bonding joints in Cu/Sn/Ni(P) and Ni/Sn/(OSP)Cu structures for power modules
YHK S. Baek, G. W. Jeong, J. H. Son, M. S. Kim, H. B. R. Lee, J. Kim
Journal of Materials Science: Materials in Electronics, 2021
72021
Fabrication of Ag circuit embedded in PDMS substrate and its mechanical and electrical property with variations of photonic energy
K.H Jung, J Kim, B.G. Park, C.J. Lee, H. J. Sung, S. B. Jung
Journal of Alloys and Compounds 748, 898-904, 2018
52018
Interfacial reactions and mechanical properties of Sn–3.0Ag–0.5Cu solder with pure Pd or Pd(P) layers containing thin-Au/Pd/Ni(P) surface-finished PCBs during aging
J Kim, JH Back, SB Jung, JW Yoon
Journal of Material Science : Materials in Electronics 31 (1), 4027-4039, 2020
42020
Effect of Ar Plasma Treatment for Surface of Insert Metal on Property of TLP Bonding Joint for Power Module
S. Baek, D.Y. Yu, J.H. Son, J. Bang, J. Kim, M. S. Kim, H.B.R. Lee, Y. H. Ko
Journal of Welding and Joining, 2020
32020
Effects of Ni layer thickness of thin-ENEPIG surface finishes on the interfacial reactions and shear strength of Sn-3.0 Ag–0.5 Cu solder joints during aging
J Kim, JH Back, SB Jung, JW Yoon
Journal of Materials Science: Materials in Electronics 30 (14), 12911-12923, 2019
32019
Effective (Pd, Ni) Sn4 diffusion barrier to suppress brittle fracture at Sn-58Bi-xAg solder joint with Ni (P)/Pd (P)/Au metallization pad
J Kim, DY Park, B Ahn, J Bang, MS Kim, HS Park, Y Sohn, YH Ko
Microelectronics Reliability 129, 114472, 2022
22022
Microstructure and mechanical properties of Ag nanoparticles-modified Sn–58Bi/Cu solder joints during liquid-state reaction
DY Park, J Kim, DY Yu, S Yoo, HS Park, Y Sohn, YH Ko
Journal of Materials Science: Materials in Electronics 32, 28346-28357, 2021
12021
Effects of Ni(P) layer thickness and Pdlayer type in thin-Au/Pd/Ni(P) surface finishes on interfacial reactions andmechanical strength of Sn–58Bi solder joints during aging
J Kim, SB Jung, JW Yoon
Journal of Materials Science : Materials in Electronics, 2020
12020
Joint reliability of Al wire bonding on OSP and ENIG surface-finished substrates under complex stress induced with current and temperature
YHK Byeongjin Ahn, Jahyeon Kim, Gyeong-Yeong Cheon, Tae-Ik Lee, Young-Bae ...
Journal of Material science: Material in electronics, 2022
2022
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