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Wei-Hsun Chen
Wei-Hsun Chen
Materials Engineering, Purdue University
Verified email at purdue.edu - Homepage
Title
Cited by
Cited by
Year
Effects of local grain misorientation and β-Sn elastic anisotropy on whisker and hillock formation
P Sarobol, WH Chen, AE Pedigo, P Su, JE Blendell, CA Handwerker
Journal of Materials Research 28 (5), 747-756, 2013
272013
Recrystallization as a nucleation mechanism for whiskers and hillocks on thermally cycled Sn-alloy solder films
P Sarobol, JP Koppes, WH Chen, P Su, JE Blendell, CA Handwerker
Materials Letters 99, 76-80, 2013
262013
Effect of crystallographic texture, anisotropic elasticity, and thermal expansion on whisker formation in β-Sn thin films
WH Chen, P Sarobol, JR Holaday, CA Handwerker, JE Blendell
Journal of Materials Research 29, 197-206, 2014
232014
Spontaneous formation of ordered nanobubbles in anodic tungsten oxide during anodization
WH Chen, MY Lai, KT Tsai, CY Liu, YL Wang
The Journal of Physical Chemistry C 115 (38), 18406-18411, 2011
202011
A predictive model for whisker formation based on local microstructure and grain boundary properties
P Sarobol, Y Wang, WH Chen, AE Pedigo, JP Koppes, JE Blendell, ...
JOM 65 (10), 1350-1361, 2013
132013
Local variations in grain formation, grain boundary sliding, and whisker growth along grain boundaries in large-grain Sn films
WH Chen, C Wang, P Sarobol, J Blendell, C Handwerker
Scripta Materialia 187, 458-463, 2020
72020
Heterogeneous Stress Relaxation Processes at Grain Boundaries in High-Sn Solder Films: Effects of Sn Anisotropy and Grain Geometry During Thermal Cycling
WH Chen, P Sarobol, CA Handwerker, JE Blendell
JOM 68 (11), 2888-2899, 2016
62016
Evaluation of local anisotropic elasticity and thermal expansion on whisker formation sites in beta-tin thin films
WH Chen
PURDUE UNIVERSITY, 2014
12014
Whisker Formation and Stress Relaxation in Tin Thin Films
P Sarobol, A Pedigo, J Koppes, Y Wang, W Chen, P Su, J Blendell, ...
Microscopy and Microanalysis 17 (S2), 1846-1847, 2011
12011
Quantitative Assessment of Stress Relaxation in Tin Films by the Formation of Whiskers, Hillocks, and Other Surface Defects
NG Clore, DD Fritz, WH Chen, ME Williams, JE Blendell, CA Handwerker
Mitigating Tin Whisker Risks: Theory and Practice, 187-214, 2016
2016
Effects of Grain Misorientation & Strain Distribution on Whisker Formation on Electroplated Sn-Cu films
C Handwerker, P Sarobol, WH Chen, P Su, J Blendell
AIP Conference Proceedings, 2012
2012
Tin Whisker and Hillock Formation on Thermally Cycled, Large Grained Pb-Free Solder Alloy Films
J Koppes, P Sarobol, WH Chen, P Su, J Blendell, C Handwerker
AIP Conference Proceedings, 2012
2012
Representation in 3 D and Stress Response of Tin Whiskers
B Anglin, P Sarobol, A Pedigo, WH Chen, R Lebensohn, J Blendell, ...
Minerals, Metals and Materials Society/AIME, 420 Commonwealth Dr., P. O. Box …, 2012
2012
Heterogeneous Stress Relaxation in Thin Films: Whiskers, Hillocks, and Beyond
CA Handwerker, J Blendell, WH Chen, P Sarobol, Y Wang
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Articles 1–14