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Vaishali Dhare
Vaishali Dhare
Institute of Technology, Nirma University, Ahmedabad
Verified email at nirmauni.ac.in
Title
Cited by
Cited by
Year
Defect characterization and testing of QCA devices and circuits: A survey
V Dhare, U Mehta
2015 19th International Symposium on VLSI Design and Test, 1-2, 2015
222015
Quantum-dot cellular automata (QCA): a survey
U Mehta, V Dhare
arXiv preprint arXiv:1711.08153, 2017
212017
A simple synthesis process for combinational QCA circuits: QSynthesizer
V Dhare, U Mehta
2019 32nd international conference on VLSI design and 2019 18th …, 2019
92019
Multiple missing cell defect modeling for QCA devices
VH Dhare, US Mehta
Journal of Electronic Testing 34, 623-641, 2018
82018
Development of basic fault model and corresponding ATPG for single input missing cell deposition defects in majority voter of QCA
V Dhare, U Mehta
2016 IEEE Region 10 Conference (TENCON), 2354-2359, 2016
82016
Fault analysis of QCA combinational circuit at layout & logic level
V Dhare, U Mehta
2015 IEEE International WIE Conference on Electrical and Computer …, 2015
72015
Single missing cell deposition defect analysis of sequential reversible circuit
V Dhare, U Mehta
2017 Nirma University International Conference on Engineering (NUiCONE), 1-4, 2017
52017
Novel optimized ultra-dense 1-bit magnitude comparator design in quantum-dot cellular automata technology based on MV32 gate
N Kandasamy, V Dhare, N Telagam
The Journal of Supercomputing 78 (17), 18666-18690, 2022
42022
Development of controllability observability aided combinational ATPG with fault reduction
V Dhare, U Mehta
International Conference on Web and Semantic Technology, 682-692, 2010
42010
Test pattern generator for MV-based QCA combinational circuit targeting MMC fault models
V Dhare, U Mehta
IETE Journal of Research 68 (3), 1812-1822, 2022
32022
Test Pattern Generator for Majority Voter based QCA Combinational Circuits targeting MMC Defect
V Dhare, U Mehta
2019 IEEE European Test Symposium (ETS), 1-2, 2019
32019
Advanced ATPG based on FAN, testability measures and fault reduction
V Dhare, U Mehta
International Journal of VLSI Design & Communication Systems 5 (2), 11, 2014
32014
Implementation of compaction algorithm for ATPG generated partially specified test data
V Dhare, U Mehta
International Journal of VLSI design & Communication Systems (VLSICS) 4 (1), 2013
32013
Object Oriented Implementation of Combinational Controllability and Observability Algorithms
VH Dhare, U Mehta
International Journal on Electronics Engineering: Kurukshetra, Hariyana …, 2010
32010
Implementation and defect analysis of QCA based reversible combinational circuit
V Dhare, D Agarwal
Technologies for Sustainable Development, 244-249, 2020
22020
Defect Analysis of Quantum-Dot Cellular Automata Combinational Circuit Using HLDQ
V Dhare, U Mehta
International Journal of Advanced Research in Engineering and Technology 7 …, 2016
22016
SAF analyses of analog and mixed signal vlsi circuit: Digital to analog converter
V Dhare, U Mehta
International Journal of VLSI Design & Communication Systems (VLSICS) 6 (3), 2015
22015
Analytical method for cell displacement defect quantum-dot cellular automata primitive
V Dhare, U Mehta
Journal of Electronic Science and Technology 21 (1), 100183, 2023
12023
Test generation algorithm for quantum-dot cellular automata (QCA) technology
V Dhare, U Mehta
12023
1-bit Magnitude Comparator based on ReversibleLogic using QCA Technology
V Dhare, D Modi
2023 IEEE Devices for Integrated Circuit (DevIC), 9-12, 2023
2023
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